Analysis of X-ray images and spectra (aXis2000): A toolkit for the analysis of X-ray spectromicroscopy data

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY
Adam P. Hitchcock
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引用次数: 6

Abstract

Spectromicroscopy refers to analytical methods that combine imaging and spectroscopy to provide detailed, spatially resolved analytical information about a sample, such as the type and quantitative spatial distributions of chemical components, geometric or magnetic alignment information, crystal structure, etc. The analysis of X-ray images and spectra (aXis2000) software described in this work provides a set of routines within a single, integrated, graphical-oriented package to read, display, manipulate and analyze spectromicroscopy data, with particular focus on soft X-ray spectromicroscopy methods such as scanning transmission X-ray microscopy (STXM), X-ray photoemission electron microscopy (XPEEM), scanning photoelectron X-ray microscopy (SPEM) and transmission X-ray microscopy (TXM). Here, this free software is described and compared to other software that can provide similar or complementary capabilities. Examples of spectromicroscopic analyses using advanced features of aXis2000 are provided.

x射线图像和光谱分析(aXis2000):用于分析x射线光谱显微镜数据的工具包
光谱显微镜是指将成像和光谱学相结合,提供样品详细的、空间分辨的分析信息的分析方法,如化学成分的种类和定量空间分布、几何或磁向信息、晶体结构等。本工作中描述的x射线图像和光谱分析(aXis2000)软件在一个单一的、集成的、面向图形的软件包中提供了一套例程,用于读取、显示、操作和分析光谱显微镜数据,特别侧重于软x射线光谱显微镜方法,如扫描透射x射线显微镜(STXM)、x射线光发射电子显微镜(XPEEM)、扫描光电子x射线显微镜(SPEM)和透射x射线显微镜(TXM)。在这里,对这个自由软件进行了描述,并与其他能够提供类似或互补功能的软件进行了比较。提供了使用aXis2000先进功能的光谱显微分析实例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
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