Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction

IF 1.9 4区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Design & Test Pub Date : 2023-10-01 DOI:10.1109/MDAT.2023.3261799

Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen

引用次数: 0

Abstract

Multisite testing, where multiple ICs are tested in parallel sharing the same automatic test equipment, is a widely used method today in IC high-volume test facilities. This article provides a survey of best practices to deal with the problem of site-to-site variation, specifically in the case of analog and mixed-signal ICs.

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模拟多站点测试中的站点间变化：检测和校正综述

多站点测试是目前IC大容量测试设施中广泛使用的一种方法，其中多个IC共享同一自动测试设备进行并行测试。本文提供了一份关于处理站点间变化问题的最佳实践的调查，特别是在模拟和混合信号IC的情况下。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC

CiteScore

3.80

自引率

5.00%

发文量

期刊介绍： IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.