Enabling Security of Heterogeneous Integration: From Supply Chain to In-Field Operations

IF 1.9 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Md Sami Ul Islam Sami, H. M. Kamali, Farimah Farahmandi, Fahim Rahman, M. Tehranipoor
{"title":"Enabling Security of Heterogeneous Integration: From Supply Chain to In-Field Operations","authors":"Md Sami Ul Islam Sami, H. M. Kamali, Farimah Farahmandi, Fahim Rahman, M. Tehranipoor","doi":"10.1109/MDAT.2023.3270234","DOIUrl":null,"url":null,"abstract":"Due to slowdown of Moore’s law and Dennard scaling, modern hardware design has shifted to heterogenous integration (HI) instead of traditional monolithic ICs. However, HI incurs its own security vulnerabilities. In this article, the authors analyze the security issues pertaining to HI and provide defense strategies for the same.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MDAT.2023.3270234","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 2

Abstract

Due to slowdown of Moore’s law and Dennard scaling, modern hardware design has shifted to heterogenous integration (HI) instead of traditional monolithic ICs. However, HI incurs its own security vulnerabilities. In this article, the authors analyze the security issues pertaining to HI and provide defense strategies for the same.
实现异构集成的安全性:从供应链到现场操作
由于摩尔定律和登纳德缩放的放缓,现代硬件设计已经转向异构集成(HI)而不是传统的单片集成电路。但是,HI本身也存在安全漏洞。在本文中,作者分析了与HI相关的安全问题,并提供了相应的防御策略。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
IEEE Design & Test
IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
3.80
自引率
5.00%
发文量
98
期刊介绍: IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信