Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O

IF 1.9 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
A. Pandey, Brendan Tully, Abhijeet Samudra, Ajay Nagarandal, Karthikeyan Natarajan, Rahul Singhal
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引用次数: 0

Abstract

This article discusses the method of using the functional protocol of an existing high-speed I/O port for testing. This method enables reduced GPIO pin requirement during manufacturing test and running full structural content while embedded in a functioning system. Frequency of on-chip scan networks can be increased as it is no longer limited by pin timing bottlenecks of regular, slow-speed I/Os. The same HSAT-based test infrastructure can be used for enabling system-level and in-system test for monitoring throughout the lifecycle of the chip.
基于功能协议的高速I/O在大型SoC制造、系统级和系统内测试中的新技术
本文讨论了使用现有高速I/O端口的功能协议进行测试的方法。这种方法能够在制造测试期间降低GPIO引脚需求,并在嵌入功能系统时运行完整的结构内容。片上扫描网络的频率可以增加,因为它不再受到常规低速I/O的引脚定时瓶颈的限制。相同的基于HSAT的测试基础设施可以用于实现系统级和系统内测试,以便在芯片的整个生命周期中进行监控。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Design & Test
IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
3.80
自引率
5.00%
发文量
98
期刊介绍: IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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