{"title":"A Modeling and Design Methodology of Double Exponential Pulse Generator for Simulation-Based Conducted Disturbance Immunity Testing","authors":"Jaesik Moon, J. Kwon, Eakhwan Song","doi":"10.26866/jees.2023.3.r.167","DOIUrl":null,"url":null,"abstract":"In this paper, an equivalent circuit model of a double-exponential pulse generator is proposed for use as a time-domain noise source in high-altitude electromagnetic pulse (HEMP) conducted disturbance immunity testing. The analytic relationship between the proposed equivalent circuit model and the source pulse requirements expressed by the test standards is derived. Based on this relationship, a design methodology for the equivalent circuit model is proposed to extract the circuit components that satisfy the source pulse requirements, particularly in the form of source impedance and pulse waveform requirements. The proposed design methodology is applied to design an equivalent circuit model of the double exponential pulse generator with various test modes in the conducted disturbance immunity test. The designed double exponential pulse generator is applied to a simulation-based conductive disturbance immunity testing platform based on the International Electrotechnical Commission (IEC) 61000-4-24 standard to validate the effectiveness of the proposed equivalent circuit model and design methodology.","PeriodicalId":15662,"journal":{"name":"Journal of electromagnetic engineering and science","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2023-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of electromagnetic engineering and science","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.26866/jees.2023.3.r.167","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, an equivalent circuit model of a double-exponential pulse generator is proposed for use as a time-domain noise source in high-altitude electromagnetic pulse (HEMP) conducted disturbance immunity testing. The analytic relationship between the proposed equivalent circuit model and the source pulse requirements expressed by the test standards is derived. Based on this relationship, a design methodology for the equivalent circuit model is proposed to extract the circuit components that satisfy the source pulse requirements, particularly in the form of source impedance and pulse waveform requirements. The proposed design methodology is applied to design an equivalent circuit model of the double exponential pulse generator with various test modes in the conducted disturbance immunity test. The designed double exponential pulse generator is applied to a simulation-based conductive disturbance immunity testing platform based on the International Electrotechnical Commission (IEC) 61000-4-24 standard to validate the effectiveness of the proposed equivalent circuit model and design methodology.
期刊介绍:
The Journal of Electromagnetic Engineering and Science (JEES) is an official English-language journal of the Korean Institute of Electromagnetic and Science (KIEES). This journal was launched in 2001 and has been published quarterly since 2003. It is currently registered with the National Research Foundation of Korea and also indexed in Scopus, CrossRef and EBSCO, DOI/Crossref, Google Scholar and Web of Science Core Collection as Emerging Sources Citation Index(ESCI) Journal. The objective of JEES is to publish academic as well as industrial research results and discoveries in electromagnetic engineering and science. The particular scope of the journal includes electromagnetic field theory and its applications: High frequency components, circuits, and systems, Antennas, smart phones, and radars, Electromagnetic wave environments, Relevant industrial developments.