1S-A1-1Development of an Easy-to-use Cryo-electron Microscope for Simultaneous Observation of SEM and Transmission Images

IF 1.8 4区工程技术

Microscopy Pub Date : 2017-11-01 DOI:10.1093/JMICRO/DFX040

Y. Ose, T. Sunaoshi, Yusuke Tamba, Y. Nagakubo, Junzo Azuma, R. Tamochi, M. Osumi, A. Narita, Tomoharu Matsumoto, Eiji Usukura, J. Usukura

引用次数: 0

Abstract

Researchers in all areas of medicine and biology have long awaited a user-friendly, low-acceleratingvoltage cryo-EM for a wide variety of applications. New low voltage cryo-scanning transmission electron microscope (STEM) has been developed based on conventional high-resolution SEM, which enables to observe a transmitted image and a secondary electron (SEM) image simultaneously in a fresh frozen state [1].

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一种易于使用的同时观察扫描电镜和透射图像的低温电子显微镜的研制

医学和生物学各个领域的研究人员一直期待着一种用户友好、低加速电压的低温电镜，用于各种各样的应用。在传统高分辨率扫描电镜(SEM)的基础上，研制了一种新型低压低温扫描透射电子显微镜(STEM)，可以同时观察新鲜冷冻状态下的透射图像和二次电子(SEM)图像。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microscopy 工程技术-显微镜技术

自引率

11.10%

发文量

审稿时长

>12 weeks

期刊介绍： Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.