Local structure analysis of amorphous materials by angstrom-beam electron diffraction

IF 1.8 4区 工程技术
Microscopy Pub Date : 2020-11-01 DOI:10.1093/jmicro/dfaa075
Akihiko Hirata
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引用次数: 9

Abstract

The structure analysis of amorphous materials still leaves much room for improvement. Owing to the lack of translational or rotational symmetry of amorphous materials, it is important to develop a different approach from that used for crystals for the structure analysis of amorphous materials. Here, the angstrom-beam electron diffraction method was used to obtain the local structure information of amorphous materials at a sub-nanometre scale. In addition, we discussed the relationship between the global and local diffraction intensities of amorphous structures, and verified the effectiveness of the proposed method through basic diffraction simulations. Finally, some applications of the proposed method to structural and functional amorphous materials are summarized.

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用埃束电子衍射分析非晶材料的局域结构
非晶态材料的结构分析仍有很大的改进空间。由于非晶材料缺乏平移或旋转对称性,开发一种不同于晶体的方法来分析非晶材料的结构是很重要的。这里,使用埃束电子衍射方法来获得亚纳米尺度上非晶材料的局部结构信息。此外,我们还讨论了非晶结构的全局衍射强度和局部衍射强度之间的关系,并通过基本的衍射模拟验证了所提出方法的有效性。最后,总结了该方法在结构和功能非晶材料中的一些应用。
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来源期刊
Microscopy
Microscopy 工程技术-显微镜技术
自引率
11.10%
发文量
0
审稿时长
>12 weeks
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
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