Advances in cryo-EM and ED with a cold-field emission beam and energy filtration —Refinements of the CRYO ARM 300 system in RIKEN SPring-8 center—

IF 1.8 4区 工程技术
Microscopy Pub Date : 2020-11-01 DOI:10.1093/jmicro/dfaa052
Saori Maki-Yonekura;Tasuku Hamaguchi;Hisashi Naitow;Kiyofumi Takaba;Koji Yonekura
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引用次数: 14

Abstract

We have designed and evaluated a cryo-electron microscopy (cryo-EM) system for higher-resolution single particle analysis and high-precision electron 3D crystallography. The system comprises a JEOL CRYO ARM 300 electron microscope—the first machine of this model—and a direct detection device camera, a scintillator-coupled camera, GPU clusters connected with a camera control computer and software for automated-data collection and efficient and accurate operation. The microscope provides parallel illumination of a highly coherent 300-kV electron beam to a sample from a cold-field emission gun and filters out energy-loss electrons through the sample with an in-column energy filter. The gun and filter are highly effective in improving imaging and diffraction, respectively, and have provided high quality data since July 2018. We here report on the characteristics of the cryo-EM system, updates, our progress and future plan for running such cryo-EM machines in RIKEN SPring-8 Center.
冷场发射束和能量过滤低温EM和ED的研究进展——日本理工大学SPring-8中心cryo ARM 300系统的改进--
我们设计并评估了一种用于更高分辨率单粒子分析和高精度电子3D结晶学的冷冻电子显微镜(cryo-EM)系统。该系统包括一台JEOL CRYO ARM 300电子显微镜——该型号的第一台机器——以及一台直接检测设备相机、一台闪烁体耦合相机、与相机控制计算机连接的GPU集群和用于自动数据收集和高效准确操作的软件。该显微镜从冷场发射枪向样品提供高度相干的300kV电子束的平行照明,并用柱内能量过滤器过滤掉通过样品的能量损失电子。该枪和滤波器分别在改善成像和衍射方面非常有效,自2018年7月以来提供了高质量的数据。我们在这里报道了冷冻电镜系统的特点、更新、我们的进展以及在理研SPring-8中心运行这种冷冻电镜机器的未来计划。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Microscopy
Microscopy 工程技术-显微镜技术
自引率
11.10%
发文量
0
审稿时长
>12 weeks
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
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