Synchrotron radiation X-ray imaging with large field of view and high resolution using micro-scanning method.

IF 2.4 3区 物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION
Journal of Synchrotron Radiation Pub Date : 2022-09-01 Epub Date: 2022-08-12 DOI:10.1107/S1600577522007652
Rui Sun, Yanping Wang, Jie Zhang, Tijian Deng, Qiru Yi, Bei Yu, Mei Huang, Gang Li, Xiaoming Jiang
{"title":"Synchrotron radiation X-ray imaging with large field of view and high resolution using micro-scanning method.","authors":"Rui Sun,&nbsp;Yanping Wang,&nbsp;Jie Zhang,&nbsp;Tijian Deng,&nbsp;Qiru Yi,&nbsp;Bei Yu,&nbsp;Mei Huang,&nbsp;Gang Li,&nbsp;Xiaoming Jiang","doi":"10.1107/S1600577522007652","DOIUrl":null,"url":null,"abstract":"<p><p>In synchrotron radiation X-ray imaging, the imaging field of view and spatial resolution are mutually restricted, which makes it impossible to have both a large field of view and high resolution when carrying out experiments. Constructing an oversampled image through the micro-scanning method and using the deconvolution algorithm to eliminate the point spread function introduced by pixel overlap can increase the resolution under a fixed imaging field of view, thereby improving the ratio of the field of view to the spatial resolution. In this paper, numerical simulation and synchrotron radiation experiments are carried out with a different number of micro-scanning steps. In numerical simulation experiments only affected by the image pixel size, as the number of micro-scanning steps increases, the ability of the oversampled image with deconvolution to improve the resolution is stronger. The achievable resolution of the oversampled image with deconvolution is basically the same as that of the sample image. In the synchrotron radiation experiments, the resolution of the oversampled image with deconvolution in the 2 × 2 mode is significantly improved. However, as the number of micro-scanning steps increases, the resolution improvement is limited, or even no longer improved. Finally, by analyzing the results of numerical simulation and synchrotron radiation experiments, three factors (four other factors affecting the resolution besides the camera resolution, translational accuracy of micro-scanning, and the signal-to-noise ratio of projections) affecting the micro-scanning method are proposed and verified by experiments.</p>","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"29 Pt 5","pages":"1241-1250"},"PeriodicalIF":2.4000,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9455207/pdf/","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Synchrotron Radiation","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1107/S1600577522007652","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2022/8/12 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 1

Abstract

In synchrotron radiation X-ray imaging, the imaging field of view and spatial resolution are mutually restricted, which makes it impossible to have both a large field of view and high resolution when carrying out experiments. Constructing an oversampled image through the micro-scanning method and using the deconvolution algorithm to eliminate the point spread function introduced by pixel overlap can increase the resolution under a fixed imaging field of view, thereby improving the ratio of the field of view to the spatial resolution. In this paper, numerical simulation and synchrotron radiation experiments are carried out with a different number of micro-scanning steps. In numerical simulation experiments only affected by the image pixel size, as the number of micro-scanning steps increases, the ability of the oversampled image with deconvolution to improve the resolution is stronger. The achievable resolution of the oversampled image with deconvolution is basically the same as that of the sample image. In the synchrotron radiation experiments, the resolution of the oversampled image with deconvolution in the 2 × 2 mode is significantly improved. However, as the number of micro-scanning steps increases, the resolution improvement is limited, or even no longer improved. Finally, by analyzing the results of numerical simulation and synchrotron radiation experiments, three factors (four other factors affecting the resolution besides the camera resolution, translational accuracy of micro-scanning, and the signal-to-noise ratio of projections) affecting the micro-scanning method are proposed and verified by experiments.

Abstract Image

Abstract Image

Abstract Image

微扫描同步辐射大视场高分辨率x射线成像技术。
在同步辐射x射线成像中,成像视场和空间分辨率是相互制约的,这使得在进行实验时不可能同时拥有大视场和高分辨率。通过微扫描方法构造过采样图像,利用反卷积算法消除像素重叠引入的点扩散函数,可以提高固定成像视场下的分辨率,从而提高视场与空间分辨率的比值。本文采用不同的微扫描步数进行了数值模拟和同步辐射实验。在仅受图像像素大小影响的数值模拟实验中,随着微扫描步数的增加,过采样图像反卷积提高分辨率的能力更强。反卷积过采样图像的可实现分辨率与样本图像基本相同。在同步辐射实验中,对2 × 2模式下的过采样图像进行反卷积处理后,分辨率得到了显著提高。然而,随着微扫描步数的增加,分辨率的提高是有限的,甚至不再提高。最后,通过对数值模拟和同步辐射实验结果的分析,提出了影响微扫描方法的3个因素(除相机分辨率、微扫描平动精度和投影信噪比外的4个影响分辨率的因素),并通过实验进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
5.10
自引率
12.00%
发文量
289
审稿时长
4-8 weeks
期刊介绍: Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信