Impact of afterglow correction uncertainty on down-scattered neutron imaging at the National Ignition Facility.

IF 1.6 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
A I de Santiago, S A Ricketts, C H Wilde, K R Moran, S S Glenn, E R Casco, J S Cowan, C R Danly, V E Fatherley, D N Fittinghoff, H J Jorgenson, M P Selwood, P L Volegov
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引用次数: 0

Abstract

Down-scattered neutron imaging (6-12 MeV) at the National Ignition Facility diagnoses cold fuel assembly in inertial confinement fusion experiments. Residual primary neutron signal (afterglow) from scintillator decay must be subtracted from down-scattered measurements. With afterglow correction uncertainty comparable to the signal itself (both at the 1%-4% level relative to primary), reconstructions are highly sensitive to correction errors. We examine this sensitivity by perturbing the afterglow correction factor from -75% to +75% in 5% increments for shot N250126. Legendre P0 contour analysis at 17%, 50%, 80%, and 90% intensity levels reveals that outer contours (17%, 50%) show <10% variation across the full perturbation range, while inner contours (80%, 90%) exhibit steep sensitivity to over-subtraction, with >40% variation as the correction factor increases. The sensitivity is asymmetric: over-subtraction causes rapid degradation and peak location shifts due to the oblate primary geometry, while under-subtraction produces near-linear changes. For analyses of internal hotspot features, under-subtraction is preferable to over-subtraction to avoid reconstruction artifacts.

余辉校正不确定度对国家点火装置下散射中子成像的影响。
国家点火装置的下散射中子成像(6- 12mev)诊断惯性约束聚变实验中的冷燃料组件。闪烁体衰变产生的残余初级中子信号(余辉)必须从下散射测量中减去。由于余辉校正的不确定性与信号本身相当(都在1%-4%的水平相对于初级),重建对校正误差高度敏感。我们通过以5%的增量将拍摄N250126的余辉校正系数从-75%扰动到+75%来检验这种灵敏度。在17%、50%、80%和90%强度水平下的Legendre P0轮廓分析显示,随着校正因子的增加,外部轮廓(17%、50%)呈现出40%的变化。灵敏度是不对称的:由于原始几何形状扁平化,过度减法会导致快速退化和峰值位置移动,而欠减法会产生近线性变化。对于内部热点特征的分析,为了避免重建伪影,少减优于多减。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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