{"title":"4-Transistor IGZO Ternary Content Addressable Memory Enabling Large-Scale Array Integration for In-Memory Computing","authors":"Taewon Seo;Taejun Ha;Seunghyun Son;Sunmean Kim;Yoonyoung Chung","doi":"10.1109/LED.2026.3725692","DOIUrl":null,"url":null,"abstract":"We report a 4-transistor (4T) Ternary Content Addressable Memory (TCAM) that significantly reduces the physical footprint by employing dual-gate IGZO transistors. High-density TCAMs are essential components for memory augmented neural networks and advanced computing systems; however, the large physical footprint remains a significant limitation in conventional designs. The proposed TCAM unit cell adopts a simplified structure, reducing the transistor count to four, which is substantially lower than previous SRAM-based (16T) and oxide semiconductor-based (6T) counterparts. Moreover, connecting the search line directly to the gate electrode effectively mitigates IR drop, enhancing the design’s suitability for large-scale memory applications. Experimental results validate the proposed design, demonstrating accurate Hamming distance computations (155.9 nA/bit), high endurance (<inline-formula> <tex-math>$\\gt$ </tex-math></inline-formula><inline-formula> <tex-math>$10^{{10}}$ </tex-math></inline-formula> cycles), and fast operation with 350 ps search latency and 220 ns write time.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"47 10","pages":"2015-2018"},"PeriodicalIF":4.6000,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11661739/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/8/21 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
We report a 4-transistor (4T) Ternary Content Addressable Memory (TCAM) that significantly reduces the physical footprint by employing dual-gate IGZO transistors. High-density TCAMs are essential components for memory augmented neural networks and advanced computing systems; however, the large physical footprint remains a significant limitation in conventional designs. The proposed TCAM unit cell adopts a simplified structure, reducing the transistor count to four, which is substantially lower than previous SRAM-based (16T) and oxide semiconductor-based (6T) counterparts. Moreover, connecting the search line directly to the gate electrode effectively mitigates IR drop, enhancing the design’s suitability for large-scale memory applications. Experimental results validate the proposed design, demonstrating accurate Hamming distance computations (155.9 nA/bit), high endurance ($\gt$ $10^{{10}}$ cycles), and fast operation with 350 ps search latency and 220 ns write time.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.