{"title":"Performance Enhancement of IGZO Thin-Film Transistors by Ultrathin Te Back-Channel Heterojunction Capping","authors":"Kai-Jhih Gan;Chong Ma;Zefu Zhao;Jialong Xiang;Tiaoyang Li;Shaohao Wang;Dun-Bao Ruan","doi":"10.1109/LED.2026.3724062","DOIUrl":null,"url":null,"abstract":"Ultrathin p-type capping layers were introduced to modulate the back-channel surface of IGZO thin-film transistors (TFTs). Among Te, NiO<sub>x</sub>, and SnO<sub>x</sub> capping layers, the Te-capped IGZO TFT exhibits the best balanced performance, with a subthreshold swing (SS) of 67.1 mV/dec, a field-effect mobility (<inline-formula> <tex-math>$\\mu _{\\text {FE}}\\text {)}$ </tex-math></inline-formula> of 25.6 cm<sup>2</sup>/V<inline-formula> <tex-math>$\\cdot $ </tex-math></inline-formula>s, an on/off current (I<sub>on</sub>/<inline-formula> <tex-math>$\\mathrm{I}_{\\text {off}}\\text {)}$ </tex-math></inline-formula> ratio of <inline-formula> <tex-math>${1}.{06}\\times {10} ^{{9}}$ </tex-math></inline-formula>, and a threshold voltage (<inline-formula> <tex-math>$\\mathrm{V}_{\\text {TH}}\\text {)}$ </tex-math></inline-formula> of −0.035 V. Compared with the control device, Te capping reduces SS by 63%, enhances <inline-formula> <tex-math>$\\mu _{\\text {FE}}$ </tex-math></inline-formula> by 43%, and shifts V<sub>TH</sub> positively by 0.945 V. The I<sub>on</sub>/I<sub>off</sub> ratio also increases by 49.3 times. The 2-nm Te layer therefore enables simultaneous improvement in switching steepness, carrier transport, and V<sub>TH</sub> control through back-channel modulation.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"47 10","pages":"2067-2070"},"PeriodicalIF":4.6000,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11676059/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/9/2 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Ultrathin p-type capping layers were introduced to modulate the back-channel surface of IGZO thin-film transistors (TFTs). Among Te, NiOx, and SnOx capping layers, the Te-capped IGZO TFT exhibits the best balanced performance, with a subthreshold swing (SS) of 67.1 mV/dec, a field-effect mobility ($\mu _{\text {FE}}\text {)}$ of 25.6 cm2/V$\cdot $ s, an on/off current (Ion/$\mathrm{I}_{\text {off}}\text {)}$ ratio of ${1}.{06}\times {10} ^{{9}}$ , and a threshold voltage ($\mathrm{V}_{\text {TH}}\text {)}$ of −0.035 V. Compared with the control device, Te capping reduces SS by 63%, enhances $\mu _{\text {FE}}$ by 43%, and shifts VTH positively by 0.945 V. The Ion/Ioff ratio also increases by 49.3 times. The 2-nm Te layer therefore enables simultaneous improvement in switching steepness, carrier transport, and VTH control through back-channel modulation.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.