Ultrahigh Detectivity Colloidal Quantum dot Avalanche Photodetectors Driven by Electron Mobility of the n-Type Layer

IF 5.9 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Advanced Electronic Materials Pub Date : 2026-10-12 Epub Date: 2026-09-22 DOI:10.1002/aelm.70584
Changjo Kim, Byeongsu Kim
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引用次数: 0

Abstract

Colloidal quantum dots (CQDs) are pragmatic candidates for infrared photodetectors due to their high absorption coefficient in the infrared region and solution processability. In addition, an incorporation of avalanche multiplication within the CQD region offers a route to achieve ultrahigh detectivity (D*) in CQD-based infrared photodetectors. Herein, we clarify how the electron mobility of n-type layer would affect to the detection performances in the CQD-based avalanche photodetector (CQD-APD). The introduction of ZnO nanoparticles (NPs) having high electron mobility as n-type layer suppresses the electron accumulation at the CQD/n-type interfaces, thereby mitigating the defect-mediated trapping-detrapping processes and reducing the flicker noise current in our CQD-APD. Moreover, the reduction of accumulated electrons alleviates a formation of potential barrier at CQD/n-type interfaces, enabling the initiation of avalanche multiplication with lower energy threshold. Our CQD-APD with optimal n-type layer demonstrates an outstanding multiplication gain exceeding 400 and a peak detectivity of 1.4 × 1015 Jones at a wavelength of 940 nm.

n型层电子迁移率驱动的超高探测性胶体量子点雪崩光电探测器
胶体量子点(CQDs)由于其在红外区的高吸收系数和溶液可加工性而成为红外光电探测器的实用候选者。此外,在CQD区域内结合雪崩倍增,为实现基于CQD的红外光电探测器的超高探测率(D *)提供了一条途径。本文阐明了n型层的电子迁移率如何影响基于CQD的雪崩光电探测器(CQD - APD)的探测性能。引入具有高电子迁移率的ZnO纳米粒子(NPs)作为n型层,抑制了CQD/n型界面上的电子积累,从而减轻了缺陷介导的捕获-去捕获过程,降低了CQD - APD中的闪烁噪声电流。此外,积累电子的减少减轻了CQD/n -型界面上势垒的形成,使雪崩倍增的启动具有较低的能量阈值。我们的具有最佳n型层的CQD - APD在940 nm波长下具有超过400的倍增增益和1.4 × 10 15 Jones的峰值探测率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
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