Unsupervised deep learning for limited-angle STEM-EDX tomography: application to 3D chemical analysis of phase-change memory devices

IF 13.1 1区 材料科学 Q1 CHEMISTRY, PHYSICAL
Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi
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引用次数: 0

Abstract

Energy-dispersive X-ray (EDX) tomography in scanning transmission electron microscopy (STEM) enables three-dimensional elemental mapping at the nanoscale. However, its application remains challenging when sample geometry severely restricts the accessible tilt range, and the electron dose must be limited to prevent beam damage. Limited-angle acquisition produces missing-wedge artifacts, including elongation and anisotropic resolution, while low-dose measurements further degrade reconstruction quality and hinder reliable quantification. Here, we introduce an unsupervised deep-learning framework combining a Deep Image Prior with total-variation regularization (DIP-TV) for STEM-EDX tomography under extremely limited-angle conditions. We further propose a multi-channel formulation, DIPm-TV, that jointly reconstructs multiple elemental volumes by exploiting their spatial correlations. Using a synthetic three-channel phantom, we show that DIPm-TV substantially reduces artifacts arising from severe angular limitations in the presence of moderate noise, outperforming the simultaneous iterative reconstruction technique and compressed-sensing-based approaches. We then apply DIPm-TV to two Ge–Sb–Te-based memory devices: an as-fabricated virgin device and a device programmed into the SET state, both prepared as conventional cross-sectional focused-ion-beam lamellae. Under a severely limited tilt range (±40°) and a low-dose (\(2.0\times {10}^{5}{e}^{-}{\text{\AA }}^{-2}\)), DIPm-TV yields reliable voxel-by-voxel 3D elemental maps from EDX signals alone, without external structural priors such as HAADF-STEM images. The reconstructed volumes exhibit near-isotropic spatial resolution and reveal compositional heterogeneities associated with device operation. This approach enables 3D chemical characterization of semiconductor devices in experimentally accessible sample geometries for which conventional reconstruction methods are strongly compromised by angular limitations.
无监督深度学习的有限角度STEM-EDX断层扫描:应用于相变存储器件的三维化学分析
扫描透射电子显微镜(STEM)中的能量色散x射线(EDX)断层扫描能够在纳米尺度上进行三维元素映射。然而,当样品的几何形状严重限制了可访问的倾斜范围,并且必须限制电子剂量以防止光束损坏时,其应用仍然具有挑战性。有限角度采集会产生缺失的楔形伪影,包括伸长率和各向异性分辨率,而低剂量测量会进一步降低重建质量,阻碍可靠的量化。在这里,我们引入了一个无监督深度学习框架,将深度图像先验与全变分正则化(DIP-TV)相结合,用于极有限角度条件下的STEM-EDX断层扫描。我们进一步提出了一个多通道公式,DIPm-TV,通过利用它们的空间相关性来共同重建多个元素体积。使用合成三通道幻象,我们表明DIPm-TV在存在中等噪声的情况下大大减少了由严重角度限制引起的伪影,优于同步迭代重建技术和基于压缩感知的方法。然后,我们将DIPm-TV应用于两个基于ge - sb - te的存储器件:一个是预制的原始器件,一个是编程为SET状态的器件,两者都制备为传统的横截面聚焦离子束片。在非常有限的倾斜范围(±40°)和低剂量(\(2.0\times {10}^{5}{e}^{-}{\text{\AA }}^{-2}\))下,DIPm-TV仅从EDX信号产生可靠的逐体素3D元素图,而无需外部结构先验,如HAADF-STEM图像。重建的体积显示出近各向同性的空间分辨率,并揭示了与设备操作相关的成分异质性。这种方法使半导体器件的三维化学表征能够在实验上可获得的样品几何形状中进行,而传统的重建方法受到角度限制的严重损害。
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来源期刊
npj Computational Materials
npj Computational Materials Mathematics-Modeling and Simulation
CiteScore
15.30
自引率
5.20%
发文量
229
审稿时长
6 weeks
期刊介绍: npj Computational Materials is a high-quality open access journal from Nature Research that publishes research papers applying computational approaches for the design of new materials and enhancing our understanding of existing ones. The journal also welcomes papers on new computational techniques and the refinement of current approaches that support these aims, as well as experimental papers that complement computational findings. Some key features of npj Computational Materials include a 2-year impact factor of 12.241 (2021), article downloads of 1,138,590 (2021), and a fast turnaround time of 11 days from submission to the first editorial decision. The journal is indexed in various databases and services, including Chemical Abstracts Service (ACS), Astrophysics Data System (ADS), Current Contents/Physical, Chemical and Earth Sciences, Journal Citation Reports/Science Edition, SCOPUS, EI Compendex, INSPEC, Google Scholar, SCImago, DOAJ, CNKI, and Science Citation Index Expanded (SCIE), among others.
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