Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi
{"title":"Unsupervised deep learning for limited-angle STEM-EDX tomography: application to 3D chemical analysis of phase-change memory devices","authors":"Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi","doi":"10.1038/s41524-026-02325-1","DOIUrl":null,"url":null,"abstract":"Energy-dispersive X-ray (EDX) tomography in scanning transmission electron microscopy (STEM) enables three-dimensional elemental mapping at the nanoscale. However, its application remains challenging when sample geometry severely restricts the accessible tilt range, and the electron dose must be limited to prevent beam damage. Limited-angle acquisition produces missing-wedge artifacts, including elongation and anisotropic resolution, while low-dose measurements further degrade reconstruction quality and hinder reliable quantification. Here, we introduce an unsupervised deep-learning framework combining a Deep Image Prior with total-variation regularization (DIP-TV) for STEM-EDX tomography under extremely limited-angle conditions. We further propose a multi-channel formulation, DIPm-TV, that jointly reconstructs multiple elemental volumes by exploiting their spatial correlations. Using a synthetic three-channel phantom, we show that DIPm-TV substantially reduces artifacts arising from severe angular limitations in the presence of moderate noise, outperforming the simultaneous iterative reconstruction technique and compressed-sensing-based approaches. We then apply DIPm-TV to two Ge–Sb–Te-based memory devices: an as-fabricated virgin device and a device programmed into the SET state, both prepared as conventional cross-sectional focused-ion-beam lamellae. Under a severely limited tilt range (±40°) and a low-dose (\\(2.0\\times {10}^{5}{e}^{-}{\\text{\\AA }}^{-2}\\)), DIPm-TV yields reliable voxel-by-voxel 3D elemental maps from EDX signals alone, without external structural priors such as HAADF-STEM images. The reconstructed volumes exhibit near-isotropic spatial resolution and reveal compositional heterogeneities associated with device operation. This approach enables 3D chemical characterization of semiconductor devices in experimentally accessible sample geometries for which conventional reconstruction methods are strongly compromised by angular limitations.","PeriodicalId":19342,"journal":{"name":"npj Computational Materials","volume":"31 1","pages":""},"PeriodicalIF":13.1000,"publicationDate":"2026-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"npj Computational Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1038/s41524-026-02325-1","RegionNum":1,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
Abstract
Energy-dispersive X-ray (EDX) tomography in scanning transmission electron microscopy (STEM) enables three-dimensional elemental mapping at the nanoscale. However, its application remains challenging when sample geometry severely restricts the accessible tilt range, and the electron dose must be limited to prevent beam damage. Limited-angle acquisition produces missing-wedge artifacts, including elongation and anisotropic resolution, while low-dose measurements further degrade reconstruction quality and hinder reliable quantification. Here, we introduce an unsupervised deep-learning framework combining a Deep Image Prior with total-variation regularization (DIP-TV) for STEM-EDX tomography under extremely limited-angle conditions. We further propose a multi-channel formulation, DIPm-TV, that jointly reconstructs multiple elemental volumes by exploiting their spatial correlations. Using a synthetic three-channel phantom, we show that DIPm-TV substantially reduces artifacts arising from severe angular limitations in the presence of moderate noise, outperforming the simultaneous iterative reconstruction technique and compressed-sensing-based approaches. We then apply DIPm-TV to two Ge–Sb–Te-based memory devices: an as-fabricated virgin device and a device programmed into the SET state, both prepared as conventional cross-sectional focused-ion-beam lamellae. Under a severely limited tilt range (±40°) and a low-dose (\(2.0\times {10}^{5}{e}^{-}{\text{\AA }}^{-2}\)), DIPm-TV yields reliable voxel-by-voxel 3D elemental maps from EDX signals alone, without external structural priors such as HAADF-STEM images. The reconstructed volumes exhibit near-isotropic spatial resolution and reveal compositional heterogeneities associated with device operation. This approach enables 3D chemical characterization of semiconductor devices in experimentally accessible sample geometries for which conventional reconstruction methods are strongly compromised by angular limitations.
期刊介绍:
npj Computational Materials is a high-quality open access journal from Nature Research that publishes research papers applying computational approaches for the design of new materials and enhancing our understanding of existing ones. The journal also welcomes papers on new computational techniques and the refinement of current approaches that support these aims, as well as experimental papers that complement computational findings.
Some key features of npj Computational Materials include a 2-year impact factor of 12.241 (2021), article downloads of 1,138,590 (2021), and a fast turnaround time of 11 days from submission to the first editorial decision. The journal is indexed in various databases and services, including Chemical Abstracts Service (ACS), Astrophysics Data System (ADS), Current Contents/Physical, Chemical and Earth Sciences, Journal Citation Reports/Science Edition, SCOPUS, EI Compendex, INSPEC, Google Scholar, SCImago, DOAJ, CNKI, and Science Citation Index Expanded (SCIE), among others.