{"title":"Using Rectifier Diodes as Photoconductive High-Voltage Switches for Pulse Generation: TCAD Modeling and Experimental Study","authors":"Lionel Michard;Philippe Leveque;Vincent Couderc;Delia Arnaud-Cormos","doi":"10.1109/TED.2026.3710683","DOIUrl":null,"url":null,"abstract":"An off-the-shelf rectifier diode (RD) is utilized as a high-voltage nanosecond closing switch by triggering transient photoconductivity. Compared to high-resistivity bulk silicon, structures made of PIN junction stacks allow withstanding significantly higher voltage biases with drastically lower dark current. In this work, a silicon-based RD is analyzed through secondary ion mass spectrometry (SIMS) and simulated using technology computer-aided design software (Charon TCAD). The assembled model was experimentally validated through basic electrical measurements, including current–voltage (<inline-formula> <tex-math>$I$ </tex-math></inline-formula>–<inline-formula> <tex-math>$V$ </tex-math></inline-formula>) and capacitance–voltage (<inline-formula> <tex-math>$C$ </tex-math></inline-formula>–<inline-formula> <tex-math>$V$ </tex-math></inline-formula>) characteristics. High-voltage photoconductive switching was achieved using a picosecond, millijoule Nd:YAG laser source. Voltage pulses with an amplitude up to 7.5 kV on <inline-formula> <tex-math>$50~\\Omega $ </tex-math></inline-formula> and a rise time of 0.2 ns were obtained with a 20-ns pulse-forming line (PFL) and compared with TCAD simulations as a function of the incident optical energy. Based on the simulation results, a discussion is provided regarding the influence of avalanche and recombination processes on the switching behavior. In addition, a modification of the doping profile of the RD under study is proposed to increase commutation efficiency in terms of optical energy. This study directly compares TCAD simulations of high-voltage transient photoconductivity in silicon diodes to experimental measurements.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"73 9","pages":"5736-5744"},"PeriodicalIF":3.6000,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11609554/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/7/14 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
An off-the-shelf rectifier diode (RD) is utilized as a high-voltage nanosecond closing switch by triggering transient photoconductivity. Compared to high-resistivity bulk silicon, structures made of PIN junction stacks allow withstanding significantly higher voltage biases with drastically lower dark current. In this work, a silicon-based RD is analyzed through secondary ion mass spectrometry (SIMS) and simulated using technology computer-aided design software (Charon TCAD). The assembled model was experimentally validated through basic electrical measurements, including current–voltage ($I$ –$V$ ) and capacitance–voltage ($C$ –$V$ ) characteristics. High-voltage photoconductive switching was achieved using a picosecond, millijoule Nd:YAG laser source. Voltage pulses with an amplitude up to 7.5 kV on $50~\Omega $ and a rise time of 0.2 ns were obtained with a 20-ns pulse-forming line (PFL) and compared with TCAD simulations as a function of the incident optical energy. Based on the simulation results, a discussion is provided regarding the influence of avalanche and recombination processes on the switching behavior. In addition, a modification of the doping profile of the RD under study is proposed to increase commutation efficiency in terms of optical energy. This study directly compares TCAD simulations of high-voltage transient photoconductivity in silicon diodes to experimental measurements.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.