Shuhui Zhang;Hang Chen;Xiaoping Meng;Yuchuan Ma;Tianpeng Yang;Tingting Mi;Xiaowen Wang;Chao Liu
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引用次数: 0
Abstract
We report vertical Al0.51Ga0.49N trench metal-oxide-semiconductor (MOS) barrier Schottky (TMBS) diodes with ultralow reverse leakage current. With the trench MOS structure effectively shielding the Schottky interface from high electric fields and suppressing the image-force-induced Schottky barrier lowering (SBL) effect, the fabricated TMBS diodes maintain ultralow reverse leakage current density below $10~\mu $ A/cm2 up to 708 V. Furthermore, the vertical Al0.51Ga0.49N TMBS diodes feature excellent forward rectification characteristics, including a high $I_{\text {on}}$ /$I_{\text {off}}$ ratio of ~109, a low turn-on voltage of 2.3 V, and an ideality factor of 1.98. These results underscore the remarkable potential of vertical AlGaN power diodes for next-generation high-voltage and high-power applications.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.