A Hybrid Degradation Prediction Model for the Flexible Shaft Pulling Device in Crystal Growth Furnace

IF 2.5 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Lingxia Mu;Yang Wei;Yuhan Jiang;Shihai Wu;Youmin Zhang;Ding Liu;Biyu Lei
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引用次数: 0

Abstract

Flexible shaft pulling device is a key motion device in the process of single crystal silicon preparation. The health status of the pulling device has direct influence on crystal quality. In this paper, a hybrid model is proposed for degradation prediction of the pulling device when the monitoring data is limited and with unknown statistical distribution of degradation data. Firstly, a modified filter-based degradation prediction method is designed, where a new resampling strategy is proposed to alleviate the particle degeneracy. Then, a neural network is designed to correct the potential uncertainties due to the change of the load of the pulling device. The prediction error of the filter-based method is further used to adjust the parameters of the network. Finally, experiments are conducted to verify the performance of the proposed method using both the standard dataset and data obtained from the flexible shaft pulling device.
晶体生长炉柔性轴拉装置的混合退化预测模型
柔性轴拉装置是单晶硅制备过程中的关键运动装置。拉拔装置的健康状况直接影响晶体质量。针对监测数据有限且退化数据统计分布未知的情况,提出了一种混合模型来预测牵引装置的退化。首先,设计了一种改进的基于滤波器的退化预测方法,提出了一种新的重采样策略来减轻粒子的退化;然后,设计了一个神经网络来修正由于牵引装置载荷变化而产生的潜在不确定性。进一步利用基于滤波器方法的预测误差对网络参数进行调整。最后,利用标准数据集和柔性轴拉装置数据进行了实验,验证了所提方法的性能。
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来源期刊
IEEE Transactions on Semiconductor Manufacturing
IEEE Transactions on Semiconductor Manufacturing 工程技术-工程:电子与电气
CiteScore
5.20
自引率
11.10%
发文量
101
审稿时长
3.3 months
期刊介绍: The IEEE Transactions on Semiconductor Manufacturing addresses the challenging problems of manufacturing complex microelectronic components, especially very large scale integrated circuits (VLSI). Manufacturing these products requires precision micropatterning, precise control of materials properties, ultraclean work environments, and complex interactions of chemical, physical, electrical and mechanical processes.
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