Lingxia Mu;Yang Wei;Yuhan Jiang;Shihai Wu;Youmin Zhang;Ding Liu;Biyu Lei
{"title":"A Hybrid Degradation Prediction Model for the Flexible Shaft Pulling Device in Crystal Growth Furnace","authors":"Lingxia Mu;Yang Wei;Yuhan Jiang;Shihai Wu;Youmin Zhang;Ding Liu;Biyu Lei","doi":"10.1109/TSM.2026.3691078","DOIUrl":null,"url":null,"abstract":"Flexible shaft pulling device is a key motion device in the process of single crystal silicon preparation. The health status of the pulling device has direct influence on crystal quality. In this paper, a hybrid model is proposed for degradation prediction of the pulling device when the monitoring data is limited and with unknown statistical distribution of degradation data. Firstly, a modified filter-based degradation prediction method is designed, where a new resampling strategy is proposed to alleviate the particle degeneracy. Then, a neural network is designed to correct the potential uncertainties due to the change of the load of the pulling device. The prediction error of the filter-based method is further used to adjust the parameters of the network. Finally, experiments are conducted to verify the performance of the proposed method using both the standard dataset and data obtained from the flexible shaft pulling device.","PeriodicalId":451,"journal":{"name":"IEEE Transactions on Semiconductor Manufacturing","volume":"39 3","pages":"614-624"},"PeriodicalIF":2.5000,"publicationDate":"2026-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Semiconductor Manufacturing","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11511833/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/3/7 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Flexible shaft pulling device is a key motion device in the process of single crystal silicon preparation. The health status of the pulling device has direct influence on crystal quality. In this paper, a hybrid model is proposed for degradation prediction of the pulling device when the monitoring data is limited and with unknown statistical distribution of degradation data. Firstly, a modified filter-based degradation prediction method is designed, where a new resampling strategy is proposed to alleviate the particle degeneracy. Then, a neural network is designed to correct the potential uncertainties due to the change of the load of the pulling device. The prediction error of the filter-based method is further used to adjust the parameters of the network. Finally, experiments are conducted to verify the performance of the proposed method using both the standard dataset and data obtained from the flexible shaft pulling device.
期刊介绍:
The IEEE Transactions on Semiconductor Manufacturing addresses the challenging problems of manufacturing complex microelectronic components, especially very large scale integrated circuits (VLSI). Manufacturing these products requires precision micropatterning, precise control of materials properties, ultraclean work environments, and complex interactions of chemical, physical, electrical and mechanical processes.