Leveraging a Passive MRAM Crossbar for Hardware-in-the-Loop and Continual learning

IF 3.1 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
M. Drouhin;M. Grelier;M. Deroo;Y. Sassi;E. Monteblanco;N. Davila;G. Mihajlović;R. V. Chopdekar;T. S. Santos;J. A. Katine;D. Ravelosona
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引用次数: 0

Abstract

Artificial neural networks (ANNs) have enabled major advances in artificial intelligence, yet their growing computational and energy demands challenge conventional von Neumann architectures due to the costly separation of memory and processing. In-memory computing has emerged as a promising solution, particularly through memristive crossbar arrays capable of performing multiply-and-accumulate operations directly within memory. Among nonvolatile memory technologies, magnetic tunnel junctions, the core elements of MRAM, offer high endurance, nonvolatility, and CMOS compatibility, making them attractive candidates for neuromorphic systems. In this work, we report inference results on a $15 \times 15$ MRAM crossbar, benchmarking experimental measurements against numerical simulations. We further demonstrate hardware-in-the-loop (HIL) training and experimentally validate metaplasticity mechanisms enabling continual learning on simple tasks. These results highlight the potential of MRAM-based in-memory architectures for adaptive, energy-efficient, and scalable artificial intelligence (AI) hardware.
利用被动MRAM交叉杆实现硬件在环和持续学习
人工神经网络(ann)使人工智能取得了重大进展,但由于内存和处理分离的成本高昂,它们不断增长的计算和能源需求挑战了传统的冯·诺伊曼架构。内存计算已经成为一种很有前途的解决方案,特别是通过能够直接在内存中执行乘法和累加操作的记忆交叉栏数组。在非易失性存储技术中,磁隧道结是MRAM的核心元素,具有高耐用性,非易失性和CMOS兼容性,使其成为神经形态系统的有吸引力的候选者。在这项工作中,我们报告了在$15 \ × 15$ MRAM横杆上的推理结果,对数值模拟的实验测量进行了基准测试。我们进一步演示了硬件在环(HIL)训练,并通过实验验证了能够在简单任务上持续学习的元塑性机制。这些结果突出了基于mram的内存架构在自适应、节能和可扩展的人工智能(AI)硬件方面的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
5.00
自引率
4.20%
发文量
11
审稿时长
13 weeks
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