Mo-Induced Crystallization Control in Si/CuO Heterojunctions Enabling Tunable Electronic Transport and High-Performance Circular Microcavity Antennas

IF 1.9 4区 材料科学 Q3 Chemistry
Tareq Zanoon, Atef Fayez Qasrawi, Isam Alawneh, Hazem K. Khanfar
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Abstract

Herein, robust crystallization of thermally evaporated CuO on Si is achieved through the application of Mo-nanosheets, with a 20-nm coating being sufficient to induce monoclinic CuO formation and further increases in Mo thickness producing no measurable change in structural order. Mo-induced tuning of band bending and depletion width in SCM-xx devices is demonstrated at 1 MHz. The capacitance-voltage and Mott–Schottky analyses reveal a non-monotonic capacitance response with strong suppression in SCM-20. In addition, the current-voltage characteristics show increasing voltage-dependent asymmetry with Mo nanosheet thickness. Moreover, an engineered capacitively loaded circular microcavity antenna (CL-CMA) based on a vertically integrated Ag/Si/CuO/Mo/Ag heterostructure exhibits excellent resonance at 2.6, 3.07, and 3.20 GHz as a result of the Mo coating on CuO, with return loss exceeding 40 dB at 3.20 GHz and a bandwidth of 2.25 GHz, values that are promising for high-frequency applications. Furthermore, full-wave electromagnetic simulations examining how Mo thickness influences the RF behavior of Si/CuO structures contacted by Ag electrodes, reveal that a 20-nm Mo layer provides the most efficient impedance matching and deepest S11 minimum. The radiation patterns remain largely unchanged across samples. Overall, the features of the devices are promising for advanced electronic applications.

Abstract Image

Si/CuO异质结中mo诱导结晶控制,实现可调谐电子输运和高性能圆微腔天线
在这里,通过Mo纳米片的应用,在Si上实现了热蒸发CuO的强大结晶,20纳米的涂层足以诱导单斜CuO的形成,并且Mo厚度的进一步增加不会产生可测量的结构顺序变化。在1兆赫时,sc -xx器件中mo诱导的带弯曲和耗尽宽度调谐被证明。电容-电压和Mott-Schottky分析表明,在SCM-20中具有强抑制的非单调电容响应。此外,电流-电压特性随Mo纳米片厚度的增加而增加。此外,基于垂直集成Ag/Si/CuO/Mo/Ag异质结构的工程电容负载圆形微腔天线(CL-CMA)在2.6、3.07和3.20 GHz时表现出优异的谐振特性,由于在CuO上涂有Mo涂层,在3.20 GHz时回波损耗超过40 dB,带宽为2.25 GHz,具有良好的高频应用前景。此外,全波电磁模拟研究了Mo厚度如何影响与Ag电极接触的Si/CuO结构的RF行为,结果表明,20nm的Mo层提供了最有效的阻抗匹配和最深的S11最小值。样本的辐射模式基本保持不变。总的来说,这些设备的特性对于先进的电子应用是有希望的。
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来源期刊
CiteScore
2.50
自引率
6.70%
发文量
121
审稿时长
1.9 months
期刊介绍: The journal Crystal Research and Technology is a pure online Journal (since 2012). Crystal Research and Technology is an international journal examining all aspects of research within experimental, industrial, and theoretical crystallography. The journal covers the relevant aspects of -crystal growth techniques and phenomena (including bulk growth, thin films) -modern crystalline materials (e.g. smart materials, nanocrystals, quasicrystals, liquid crystals) -industrial crystallisation -application of crystals in materials science, electronics, data storage, and optics -experimental, simulation and theoretical studies of the structural properties of crystals -crystallographic computing
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