CsPbBr3–Nanodiamonds Hybrid Wafers for Mechanically Robust, High-Performance X-Ray Detection

Abstract

CsPbBr₃–nanodiamonds (NDs) hybrid wafers are developed through a scalable solid-state grinding and cold‑pressing approach for high‑performance X‑ray detection. Incorporation of trace NDs modulates the mechanochemical reaction environment, accelerates CsPbBr₃ formation, and suppresses CsPb₂Br₅ impurities. Structural, chemical, and optical analyses reveal that NDs promote heterogeneous nucleation, enhance crystallinity, bridge grain boundaries, and passivate interfacial defects via coordination between ND surface groups and undercoordinated Pb²⁺. The optimized hybrid wafer (CsPbBr₃:NDs = 10:0.5) exhibits improved packing density, reduced reflectivity, enhanced charge transport, and significantly lower dark current. Consequently, the device achieves high sensitivity (2796.68 µC Gy_air⁻¹ cm⁻²), stable switching behavior, and an improved detection limit of 11.33 µGy s⁻¹. Thermal imaging measurements further confirm that NDs enhance heat dissipation, contributing to stable operation under continuous X‑ray exposure. This work demonstrates a robust design strategy for perovskite–diamond hybrid wafers and provides a practical route toward durable, low‑cost, and high‑sensitivity solid‑state X‑ray detectors.