{"title":"Hybrid Techniques for Power Noise Suppression on Multichip Packages","authors":"Qing Zhou;Jinsong Hu;Xiao Hu","doi":"10.1109/TSIPI.2026.3680416","DOIUrl":null,"url":null,"abstract":"Power-noise coupling among IPs is a common challenge in multichip-package (MCP) design. Voltage droop and power noise generated by an aggressor chiplet can couple to a victim chiplet through the power delivery network (PDN) on a shared power rail, particularly when the victim contains high-speed IP with stringent noise requirements. In conventional designs, coupling can be mitigated through PDN codesign and by adding board-level filtering for each chiplet. However, when the board design is frozen, noise observed on sensitive IP can become a gating item for package tape-out. This article presents three package- and die-level approaches for late-stage reduction of power-noise coupling between an aggressor and a victim. The first approach isolates PDN paths by partitioning the socket power-pin connectivity. The second approach integrates an embedded inductor to implement an in-package low-pass filter. The third approach optimizes on-die decoupling capacitance and effective resistance to attenuate high-frequency noise at the victim. Design and simulation were completed within two weeks of tape-out, demonstrating a 75% reduction in victim-rail noise.","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"5 ","pages":"53-58"},"PeriodicalIF":0.0000,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Signal and Power Integrity","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/11473333/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/4/2 0:00:00","PubModel":"Epub","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Power-noise coupling among IPs is a common challenge in multichip-package (MCP) design. Voltage droop and power noise generated by an aggressor chiplet can couple to a victim chiplet through the power delivery network (PDN) on a shared power rail, particularly when the victim contains high-speed IP with stringent noise requirements. In conventional designs, coupling can be mitigated through PDN codesign and by adding board-level filtering for each chiplet. However, when the board design is frozen, noise observed on sensitive IP can become a gating item for package tape-out. This article presents three package- and die-level approaches for late-stage reduction of power-noise coupling between an aggressor and a victim. The first approach isolates PDN paths by partitioning the socket power-pin connectivity. The second approach integrates an embedded inductor to implement an in-package low-pass filter. The third approach optimizes on-die decoupling capacitance and effective resistance to attenuate high-frequency noise at the victim. Design and simulation were completed within two weeks of tape-out, demonstrating a 75% reduction in victim-rail noise.