Monolithic Co-Integration of Vertical FET and Memristor for 1T1R Cell

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Fubo Jiao, Weiqi Dang, Gong-Jie Ruan, Jiameng Sun, Xiaoyu Sun, Dehe Kong, Yinzhi Huang, Yuxuan Yuan, Qin Liu, Sicheng Chen, Long Zhao, Cong Wang, Pengfei Wang, Chen Pan, Yajun Fu, Shi-Jun Liang
{"title":"Monolithic Co-Integration of Vertical FET and Memristor for 1T1R Cell","authors":"Fubo Jiao, Weiqi Dang, Gong-Jie Ruan, Jiameng Sun, Xiaoyu Sun, Dehe Kong, Yinzhi Huang, Yuxuan Yuan, Qin Liu, Sicheng Chen, Long Zhao, Cong Wang, Pengfei Wang, Chen Pan, Yajun Fu, Shi-Jun Liang","doi":"10.1002/aelm.202500742","DOIUrl":null,"url":null,"abstract":"One-transistor-one-memristor (1T1R) structures are essential for large-scale memristor arrays, as they enable precise read and write operations for individual cells. Currently, most 1T1R designs employ planar field-effect transistors with laterally arranged source, drain, and channel, which limit the achievable array density within a planar layout. Here, we demonstrate a compact, vertically integrated 1T1R cell by stacking a MoS<sub>2</sub> vertical field-effect transistor (VFET) with a HfO<sub>2</sub> memristor. The VFET channel achieves a footprint of only 10 µm<sup>2</sup>, which reduces reliance on advanced lithography and enables a reduced 1T1R cell area compared with some reported standard 0.18 µm silicon-based 1T1R implementations. The cell exhibits highly uniform resistive switching, with coefficients of variation (<i>C</i><sub>v</sub>) of only 3.4% in the high-resistance state (HRS) and 6.2% in the low-resistance state (LRS). Furthermore, it achieves quasi-linear conductance modulation across six discrete levels via VFET gate control. This demonstration establishes a scalable, area-efficient platform for 3D in-memory computing and neuromorphic structures.","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"9 1","pages":""},"PeriodicalIF":5.3000,"publicationDate":"2026-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/aelm.202500742","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

One-transistor-one-memristor (1T1R) structures are essential for large-scale memristor arrays, as they enable precise read and write operations for individual cells. Currently, most 1T1R designs employ planar field-effect transistors with laterally arranged source, drain, and channel, which limit the achievable array density within a planar layout. Here, we demonstrate a compact, vertically integrated 1T1R cell by stacking a MoS2 vertical field-effect transistor (VFET) with a HfO2 memristor. The VFET channel achieves a footprint of only 10 µm2, which reduces reliance on advanced lithography and enables a reduced 1T1R cell area compared with some reported standard 0.18 µm silicon-based 1T1R implementations. The cell exhibits highly uniform resistive switching, with coefficients of variation (Cv) of only 3.4% in the high-resistance state (HRS) and 6.2% in the low-resistance state (LRS). Furthermore, it achieves quasi-linear conductance modulation across six discrete levels via VFET gate control. This demonstration establishes a scalable, area-efficient platform for 3D in-memory computing and neuromorphic structures.

Abstract Image

1T1R电池垂直场效应管与忆阻器的单片协整
单晶体管-单忆阻器(1T1R)结构对于大规模忆阻器阵列是必不可少的,因为它们可以对单个单元进行精确的读写操作。目前,大多数1T1R设计采用横向排列源极、漏极和通道的平面场效应晶体管,这限制了在平面布局内可实现的阵列密度。在这里,我们展示了一个紧凑的,垂直集成的1T1R电池,通过堆叠一个MoS2垂直场效应晶体管(VFET)与一个HfO2忆阻器。VFET通道的占地面积仅为10µm2,这减少了对先进光刻技术的依赖,与一些报道的标准0.18µm硅基1T1R实现相比,可以减少1T1R单元面积。该电池表现出高度均匀的电阻开关,在高阻状态(HRS)和低阻状态(LRS)下,变异系数(Cv)仅为3.4%和6.2%。此外,它通过VFET栅极控制实现了六个离散电平的准线性电导调制。该演示为3D内存计算和神经形态结构建立了一个可扩展的,面积高效的平台。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
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