Transfer learning based on 1D-CNN for critical dimension Predication of HAR grating structures

IF 6.1 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Measurement Pub Date : 2026-05-05 Epub Date: 2026-02-27 DOI:10.1016/j.measurement.2026.120988
Pei-Lun Lan , Yu-Lung Lo , Pei-Hsien Wu
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引用次数: 0

Abstract

This study investigates the prediction of four critical dimension (CD) parameters—top space, bottom space, depth, and pitch—of high aspect ratio (HAR) structures using simulated deep ultraviolet (DUV) reflectance spectra based on transfer learning without collecting all necessary data. A large dataset was generated through COMSOL Multiphysics simulations and used to train a one-dimensional convolutional neural network (1D-CNN). Under a transfer-learning scheme in which the network was pre-trained on 5,000 ideal (smooth-sidewall) grating spectra and then fine-tuned with 1,200 scalloped (non-ideal) grating spectra, a deep learning model trained only with θi = 35° spectra achieved significant improvements with R2 values of 0.982 (top space), 0.9556 (bottom space), 0.9877 (depth), and 0.9745 (pitch), respectively. The corresponding mean absolute errors (MAE) were 0.0053, 0.0082, 0.0223, and 0.0268, while the mean absolute percentage errors (MAPE) were 0.89%, 1.36%, 0.74%, and 1.07%. These results validate the effectiveness of the CNN-based approach for rapidly and precisely characterizing the dimensional properties of HAR structures. Importantly, these results confirm the value of transfer learning: fine-tuning significantly improves prediction performance for CD estimation in HAR grating structures while reducing the required number of non-ideal (scalloped) spectra for fine-tuning to 1,200 in this study. Additionally, uncertainties arising from the intended measurement configuration and practical implementation conditions can be systematically identified and characterized using data-driven approaches. Consequently, simulation-generated data can provide a distinctive and robust framework for advanced process monitoring and can be readily integrated with measurement data in future deployment. In summary, the proposed method requires significantly less training data than the three existing comparative approaches. This strategy greatly reduces the burden of data collection and labeling, enhancing modeling efficiency. Furthermore, to assess feasibility under fabrication-induced profile non-idealities, the forward surrogate spectral prediction model is trained on ideal structures and subsequently adapted to simulated Bosch-inspired scalloped sidewalls via transfer learning, thereby reducing the need for extensive non-ideal training data and lowering the data-collection burden.
基于1D-CNN的HAR光栅结构关键尺寸预测迁移学习
本文研究了基于迁移学习的模拟深紫外(DUV)反射光谱在不收集所有必要数据的情况下,对高纵横比(HAR)结构的四个关键维度(CD)参数——顶部空间、底部空间、深度和俯仰进行预测。通过COMSOL Multiphysics模拟生成大型数据集,并用于训练一维卷积神经网络(1D-CNN)。在对5000个理想(光滑边墙)光栅光谱进行预训练,然后对1200个扇形(非理想)光栅光谱进行精细调整的迁移学习方案下,仅用θi = 35°光谱训练的深度学习模型的R2值分别为0.982(上空间)、0.9556(下空间)、0.9877(深度)和0.9745(间距),得到了显著的改进。平均绝对误差(MAE)分别为0.0053、0.0082、0.0223和0.0268,平均绝对百分比误差(MAPE)分别为0.89%、1.36%、0.74%和1.07%。这些结果验证了基于cnn的方法快速准确表征HAR结构尺寸特性的有效性。重要的是,这些结果证实了迁移学习的价值:微调显着提高了HAR光栅结构中CD估计的预测性能,同时将本研究中微调所需的非理想(扇形)光谱数量减少到1200个。此外,来自预期测量配置和实际实施条件的不确定性可以使用数据驱动的方法系统地识别和表征。因此,模拟生成的数据可以为高级过程监控提供独特而强大的框架,并且可以在未来的部署中很容易地与测量数据集成。总之,与现有的三种比较方法相比,所提出的方法所需的训练数据要少得多。该策略大大减轻了数据收集和标注的负担,提高了建模效率。此外,为了评估在制造引起的剖面非理想情况下的可行性,前向替代光谱预测模型在理想结构上进行训练,随后通过迁移学习适应模拟博世启发的扇贝侧壁,从而减少了对大量非理想训练数据的需求,降低了数据收集负担。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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