Logarithmic reordering kurtogram: An automatic resonance demodulation method for bearing fault diagnosis

IF 6.1 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Measurement Pub Date : 2026-04-28 Epub Date: 2026-02-26 DOI:10.1016/j.measurement.2026.120975
Xin Zhang , Xin Xiong , Siqian Feng , Jiaxu Wang , Laihao Yang
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引用次数: 0

Abstract

This paper proposes an automatic resonance demodulation method, the logarithmic reordering kurtogram (LRKurtogram), based on frequency band division and band evaluation for bearing fault diagnosis. Additional frequency band division is provided by the subband-reconstructed, rearranged, and ensemble dual-tree complex wavelet packet transform (SRRE-DTCWPT). Excellent performance of the dual-tree complex wavelet packet transform (DTCWPT) is thus achieved while mitigating the disorder problem in frequency subbands and band-leakage issues. Meanwhile, a robust band evaluation index based on the log-envelope, namely logarithmic reordering kurtosis, is designed to address the kurtosis index’s vulnerability to intense isolated impulse noise and its ineffectiveness. The effectiveness and improvements of the LRKurtogram are confirmed by analyzing several simulated and real signals and comparing with many advanced methods in the field. In particular, the LRKurtogram demonstrates remarkable effectiveness and robustness in extracting bearing fault characteristics from a series of signals with a wide range of signal-to-impulse noise ratios, highlighting its potential for bearing fault diagnosis.
对数重序峰度图:一种用于轴承故障诊断的自动共振解调方法
提出了一种基于频带划分和频带评估的自动共振解调方法——对数重排序kurtogram (LRKurtogram),用于轴承故障诊断。通过子带重构、重排和集合双树复小波包变换(SRRE-DTCWPT)提供额外的频带划分。双树复小波包变换(DTCWPT)具有优异的性能,同时减轻了频率子带的无序问题和频带泄漏问题。同时,设计了一种基于对数包络线的鲁棒频带评价指标,即对数重排序峰度,解决了峰度指标易受强孤立脉冲噪声影响和有效性不高的问题。通过对多个模拟信号和真实信号的分析,并与许多先进的方法进行比较,验证了LRKurtogram的有效性和改进。特别是,LRKurtogram在从一系列具有广泛信噪比的信号中提取轴承故障特征方面表现出显著的有效性和鲁棒性,突出了其在轴承故障诊断中的潜力。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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