{"title":"In Situ Electron Microscopy for Plasma-Enabled Nanoengineering","authors":"Jae Hyun Nam, Peter J. Bruggeman","doi":"10.1007/s11090-025-10608-6","DOIUrl":null,"url":null,"abstract":"<div><p>Non-thermal plasma is a versatile tool for nanoengineering applications. Nonetheless describing the typical highly dynamic mechanisms underpinning these applications remains a significant challenge, as insights have traditionally relied on <i>postmortem</i> analysis. Electron microscopy (EM) is routinely used for visualizing small scale structures, surpassing the diffraction limit of optical microscopy. <i>In situ</i> EM offers a powerful pathway to directly observe small scale processes in real-time for a broad range of research fields. However, integrating plasma environments with the high-vacuum conditions of electron microscopes remains a formidable technical challenge. This article provides an overview of <i>in situ</i> EM applications in the field of plasmas. We summarize early implementations of <i>in situ</i> plasma EM, highlight recent technical advancements and key findings, and propose future developments beneficial for advancing the field of plasma nanoengineering.</p></div>","PeriodicalId":734,"journal":{"name":"Plasma Chemistry and Plasma Processing","volume":"46 3","pages":""},"PeriodicalIF":3.5000,"publicationDate":"2026-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s11090-025-10608-6.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Plasma Chemistry and Plasma Processing","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s11090-025-10608-6","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, CHEMICAL","Score":null,"Total":0}
引用次数: 0
Abstract
Non-thermal plasma is a versatile tool for nanoengineering applications. Nonetheless describing the typical highly dynamic mechanisms underpinning these applications remains a significant challenge, as insights have traditionally relied on postmortem analysis. Electron microscopy (EM) is routinely used for visualizing small scale structures, surpassing the diffraction limit of optical microscopy. In situ EM offers a powerful pathway to directly observe small scale processes in real-time for a broad range of research fields. However, integrating plasma environments with the high-vacuum conditions of electron microscopes remains a formidable technical challenge. This article provides an overview of in situ EM applications in the field of plasmas. We summarize early implementations of in situ plasma EM, highlight recent technical advancements and key findings, and propose future developments beneficial for advancing the field of plasma nanoengineering.
期刊介绍:
Publishing original papers on fundamental and applied research in plasma chemistry and plasma processing, the scope of this journal includes processing plasmas ranging from non-thermal plasmas to thermal plasmas, and fundamental plasma studies as well as studies of specific plasma applications. Such applications include but are not limited to plasma catalysis, environmental processing including treatment of liquids and gases, biological applications of plasmas including plasma medicine and agriculture, surface modification and deposition, powder and nanostructure synthesis, energy applications including plasma combustion and reforming, resource recovery, coupling of plasmas and electrochemistry, and plasma etching. Studies of chemical kinetics in plasmas, and the interactions of plasmas with surfaces are also solicited. It is essential that submissions include substantial consideration of the role of the plasma, for example, the relevant plasma chemistry, plasma physics or plasma–surface interactions; manuscripts that consider solely the properties of materials or substances processed using a plasma are not within the journal’s scope.