A BiLSTM-based digital twin model for photovoltaic strings under current mismatch condition

IF 1.9 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Microelectronics Reliability Pub Date : 2026-03-01 Epub Date: 2026-01-19 DOI:10.1016/j.microrel.2026.116020
Yihan Chen , Mingyao Ma , Wenting Ma , Rui Zhang , Zhenyu Fang
{"title":"A BiLSTM-based digital twin model for photovoltaic strings under current mismatch condition","authors":"Yihan Chen ,&nbsp;Mingyao Ma ,&nbsp;Wenting Ma ,&nbsp;Rui Zhang ,&nbsp;Zhenyu Fang","doi":"10.1016/j.microrel.2026.116020","DOIUrl":null,"url":null,"abstract":"<div><div>The reliability of photovoltaic (PV) systems is increasingly challenged by string-level faults affecting both performance and safety. To address this issue, this study proposes a four-layer digital twin (DT) framework for intelligent monitoring and fault diagnosis of PV strings under mismatch conditions. In the virtual layer, the Sandia Array Performance Model and the Perez model are employed to estimate module temperature and plane-of-array irradiance, which are then input into a bidirectional long short-term memory (BiLSTM) network for current prediction. To enhance adaptability, a solar-elevation-based Current Mismatch Ratio (CMR) is introduced as an auxiliary correction factor, enabling dynamic modeling of mismatch behavior. The CMR-assisted BiLSTM achieves a root mean square error (RMSE) of 0.4306 and a coefficient of determination (<span><math><msup><mrow><mi>R</mi></mrow><mrow><mn>2</mn></mrow></msup></math></span>) of 0.9594, demonstrating high predictive accuracy. In the decision layer, a sliding-window mechanism combined with a support vector machine classifier distinguishes bypass diode short-circuit faults from mismatch phenomena using statistical features of <span><math><msup><mrow><mi>R</mi></mrow><mrow><mn>2</mn></mrow></msup></math></span> and RMSE. Validation based on operational data from actual PV power plants shows that the proposed DT-based approach achieves an accuracy of 96.76%, precision of 93.39%, recall of 97.96%, and an F1-score of 95.63%, outperforming traditional reference string–based methods by 1.22%, 3.12%, and 1.59% in accuracy, precision, and F1-score, respectively. These results confirm that the proposed DT framework provides real-time fault diagnosis and predictive maintenance, significantly improving the operational reliability of PV systems under dynamic environmental conditions.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"178 ","pages":"Article 116020"},"PeriodicalIF":1.9000,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271426000247","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/1/19 0:00:00","PubModel":"Epub","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

The reliability of photovoltaic (PV) systems is increasingly challenged by string-level faults affecting both performance and safety. To address this issue, this study proposes a four-layer digital twin (DT) framework for intelligent monitoring and fault diagnosis of PV strings under mismatch conditions. In the virtual layer, the Sandia Array Performance Model and the Perez model are employed to estimate module temperature and plane-of-array irradiance, which are then input into a bidirectional long short-term memory (BiLSTM) network for current prediction. To enhance adaptability, a solar-elevation-based Current Mismatch Ratio (CMR) is introduced as an auxiliary correction factor, enabling dynamic modeling of mismatch behavior. The CMR-assisted BiLSTM achieves a root mean square error (RMSE) of 0.4306 and a coefficient of determination (R2) of 0.9594, demonstrating high predictive accuracy. In the decision layer, a sliding-window mechanism combined with a support vector machine classifier distinguishes bypass diode short-circuit faults from mismatch phenomena using statistical features of R2 and RMSE. Validation based on operational data from actual PV power plants shows that the proposed DT-based approach achieves an accuracy of 96.76%, precision of 93.39%, recall of 97.96%, and an F1-score of 95.63%, outperforming traditional reference string–based methods by 1.22%, 3.12%, and 1.59% in accuracy, precision, and F1-score, respectively. These results confirm that the proposed DT framework provides real-time fault diagnosis and predictive maintenance, significantly improving the operational reliability of PV systems under dynamic environmental conditions.
电流失配条件下基于bilstm的光伏串数字孪生模型
影响光伏系统性能和安全性的串级故障对光伏系统的可靠性提出了越来越大的挑战。为了解决这一问题,本研究提出了一个四层数字孪生(DT)框架,用于错配条件下光伏串的智能监测和故障诊断。在虚拟层,采用Sandia阵列性能模型和Perez模型估计模块温度和阵列平面辐照度,然后将其输入双向长短期记忆(BiLSTM)网络进行电流预测。为了增强自适应性,引入了基于太阳高度的电流失配比(CMR)作为辅助校正因子,实现了失配行为的动态建模。cmr辅助BiLSTM的均方根误差(RMSE)为0.4306,决定系数(R2)为0.9594,具有较高的预测精度。在决策层,滑动窗口机制结合支持向量机分类器,利用R2和RMSE的统计特征将旁路二极管短路故障与失配现象区分开来。基于实际光伏电站运行数据的验证表明,本文方法的准确率为96.76%,精密度为93.39%,召回率为97.96%,f1评分为95.63%,准确度、精密度和f1评分分别比传统参考字符串方法高1.22%、3.12%和1.59%。这些结果证实了所提出的DT框架提供了实时故障诊断和预测性维护,显著提高了光伏系统在动态环境条件下的运行可靠性。
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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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