Yihan Chen , Mingyao Ma , Wenting Ma , Rui Zhang , Zhenyu Fang
{"title":"A BiLSTM-based digital twin model for photovoltaic strings under current mismatch condition","authors":"Yihan Chen , Mingyao Ma , Wenting Ma , Rui Zhang , Zhenyu Fang","doi":"10.1016/j.microrel.2026.116020","DOIUrl":null,"url":null,"abstract":"<div><div>The reliability of photovoltaic (PV) systems is increasingly challenged by string-level faults affecting both performance and safety. To address this issue, this study proposes a four-layer digital twin (DT) framework for intelligent monitoring and fault diagnosis of PV strings under mismatch conditions. In the virtual layer, the Sandia Array Performance Model and the Perez model are employed to estimate module temperature and plane-of-array irradiance, which are then input into a bidirectional long short-term memory (BiLSTM) network for current prediction. To enhance adaptability, a solar-elevation-based Current Mismatch Ratio (CMR) is introduced as an auxiliary correction factor, enabling dynamic modeling of mismatch behavior. The CMR-assisted BiLSTM achieves a root mean square error (RMSE) of 0.4306 and a coefficient of determination (<span><math><msup><mrow><mi>R</mi></mrow><mrow><mn>2</mn></mrow></msup></math></span>) of 0.9594, demonstrating high predictive accuracy. In the decision layer, a sliding-window mechanism combined with a support vector machine classifier distinguishes bypass diode short-circuit faults from mismatch phenomena using statistical features of <span><math><msup><mrow><mi>R</mi></mrow><mrow><mn>2</mn></mrow></msup></math></span> and RMSE. Validation based on operational data from actual PV power plants shows that the proposed DT-based approach achieves an accuracy of 96.76%, precision of 93.39%, recall of 97.96%, and an F1-score of 95.63%, outperforming traditional reference string–based methods by 1.22%, 3.12%, and 1.59% in accuracy, precision, and F1-score, respectively. These results confirm that the proposed DT framework provides real-time fault diagnosis and predictive maintenance, significantly improving the operational reliability of PV systems under dynamic environmental conditions.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"178 ","pages":"Article 116020"},"PeriodicalIF":1.9000,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271426000247","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/1/19 0:00:00","PubModel":"Epub","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The reliability of photovoltaic (PV) systems is increasingly challenged by string-level faults affecting both performance and safety. To address this issue, this study proposes a four-layer digital twin (DT) framework for intelligent monitoring and fault diagnosis of PV strings under mismatch conditions. In the virtual layer, the Sandia Array Performance Model and the Perez model are employed to estimate module temperature and plane-of-array irradiance, which are then input into a bidirectional long short-term memory (BiLSTM) network for current prediction. To enhance adaptability, a solar-elevation-based Current Mismatch Ratio (CMR) is introduced as an auxiliary correction factor, enabling dynamic modeling of mismatch behavior. The CMR-assisted BiLSTM achieves a root mean square error (RMSE) of 0.4306 and a coefficient of determination () of 0.9594, demonstrating high predictive accuracy. In the decision layer, a sliding-window mechanism combined with a support vector machine classifier distinguishes bypass diode short-circuit faults from mismatch phenomena using statistical features of and RMSE. Validation based on operational data from actual PV power plants shows that the proposed DT-based approach achieves an accuracy of 96.76%, precision of 93.39%, recall of 97.96%, and an F1-score of 95.63%, outperforming traditional reference string–based methods by 1.22%, 3.12%, and 1.59% in accuracy, precision, and F1-score, respectively. These results confirm that the proposed DT framework provides real-time fault diagnosis and predictive maintenance, significantly improving the operational reliability of PV systems under dynamic environmental conditions.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.