Ghusoon M. Ali , Kahtan Adnan Hussain , Shahad T. Armoot
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引用次数: 0
Abstract
This study investigates the electrical sensitivities of warm white Al/pentacene/p-Si/Pd Schottky photodiodes with respect to current–voltage (I-V), capacitance–voltage (C-V), and conductance-voltage (G-V) characteristics. The pentacene thin film is deposited using the vacuum thermal evaporation technique. The energy level parameters of the Schottky junction are estimated through energy band diagrams. Two models are introduced to analyze the forward I-V characteristics of the pentacene Schottky diode: the thermionic emission theory and the space-charge-limited current model, both of which explain the mechanisms of charge carrier transport. The I-V, C-V, and G-V characteristics were examined under both dark and warm white illumination conditions, across a voltage range of −4 to 4 V at room temperature. Moreover, a study was conducted to assess, extract, and compare the sensitivities of current (SI), capacitance (SC), and conductance (SCO). The maximum SI is 1682 % at 0 V. Therefore, the proposed device demonstrates outstanding performance as a self-powered photodetector. The maximum SC is 38 % at −2.1 V, and SCO is 370 % at −1.6 V. The variations in sensitivity values are attributed to the different detection mechanisms employed. Overall, the results demonstrate the significant potential of the current-mode Schottky pentacene diode for use as a warm white self-powered photodetector.
期刊介绍:
It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.