Sub-pixel shift compensation method for temperature-induced drift in near-infrared optical positioning systems

IF 5.6 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Lingxiang Zheng , Junyan Mei , Rongqian Yang
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引用次数: 0

Abstract

Near-infrared optical tracking systems (NIOTS), key components in surgical navigation, are widely used in various surgical procedures. However, thermal expansion within the system can cause sub-pixel shift errors, reducing positioning accuracy in 3D space. To explore these thermal effects and reduce temperature-related deviations, this study analyzes NIOTS parameters across varying temperatures and examines their relationship with thermal changes. A full-field data acquisition setup was developed, and a model was established to describe the link between temperature and sub-pixel shifts. Based on this model, a z axis correction was introduced to compensate for thermal-induced shifts. Experiments show that without compensation, the average measurement was 388.9465 mm, deviating -0.2245 mm from the true value. After compensation, the average improved to 389.1133 mm with a deviation of -0.0577 mm, achieving a 74% error reduction. Furthermore, the model maintained positioning errors within 0.1 mm in all directions during heating. These results confirm that the proposed compensation approach effectively mitigates temperature-induced drift and enhances NIOTS precision, providing a practical solution for stable and accurate surgical navigation.
近红外光学定位系统中温度诱发漂移的亚像素偏移补偿方法
近红外光学跟踪系统(NIOTS)是外科手术导航的关键部件,广泛应用于各种外科手术中。然而,系统内部的热膨胀会导致亚像素偏移误差,从而降低了3D空间中的定位精度。为了探索这些热效应并减少与温度相关的偏差,本研究分析了不同温度下NIOTS参数,并研究了它们与热变化的关系。建立了全场数据采集装置,并建立了温度与亚像元位移之间关系的模型。在此模型的基础上,引入了z轴校正来补偿热引起的位移。实验表明,在不进行补偿的情况下,平均测量值为388.9465 mm,与真实值相差-0.2245 mm。补偿后,平均值提高到389.1133 mm,偏差为-0.0577 mm,误差降低了74%。在加热过程中,模型在各个方向的定位误差都保持在0.1 mm以内。这些结果证实了所提出的补偿方法有效地缓解了温度漂移,提高了NIOTS精度,为稳定准确的手术导航提供了实用的解决方案。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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