Zhuo Li, Yuhao Yan, Xiangheng Wang, Yifei Ge, Lin Meng
{"title":"A survey of deep learning for industrial visual anomaly detection","authors":"Zhuo Li, Yuhao Yan, Xiangheng Wang, Yifei Ge, Lin Meng","doi":"10.1007/s10462-025-11287-7","DOIUrl":null,"url":null,"abstract":"<div><p>Industrial visual anomaly detection is critical for ensuring system reliability, safety, and efficiency. This paper presents a comprehensive survey of state-of-the-art anomaly detection techniques, analyzing methodologies, implementations, and recent advancements. Our survey aims to accelerate researchers’ understanding of emerging trends while providing a structured foundation for newcomers. We systematically review 196 recent papers covering five learning strategies, including fully supervised, semi-supervised, self-supervised, weakly supervised, and unsupervised approaches. This paper provides a detailed introduction to twelve industrial anomaly detection methods, revealing their theoretical foundations, technical principles, and practical applications. Additionally, we provide a detailed overview to 2D and 3D datasets for industrial visual anomaly detection. In addition, we critically analyze and summarize the experimental results, identify key performance indicators, and discuss the latest trends in the field of industrial anomaly detection. Beyond analysis, we contribute actionable insights for selecting optimal models for real-world deployment. Finally, we highlight open challenges and outline future research directions to drive innovation in this evolving field. The detailed resources are available at https://github.com/IHPCRits/IAD-Survey.</p></div>","PeriodicalId":8449,"journal":{"name":"Artificial Intelligence Review","volume":"58 9","pages":""},"PeriodicalIF":13.9000,"publicationDate":"2025-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10462-025-11287-7.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Artificial Intelligence Review","FirstCategoryId":"94","ListUrlMain":"https://link.springer.com/article/10.1007/s10462-025-11287-7","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
引用次数: 0
Abstract
Industrial visual anomaly detection is critical for ensuring system reliability, safety, and efficiency. This paper presents a comprehensive survey of state-of-the-art anomaly detection techniques, analyzing methodologies, implementations, and recent advancements. Our survey aims to accelerate researchers’ understanding of emerging trends while providing a structured foundation for newcomers. We systematically review 196 recent papers covering five learning strategies, including fully supervised, semi-supervised, self-supervised, weakly supervised, and unsupervised approaches. This paper provides a detailed introduction to twelve industrial anomaly detection methods, revealing their theoretical foundations, technical principles, and practical applications. Additionally, we provide a detailed overview to 2D and 3D datasets for industrial visual anomaly detection. In addition, we critically analyze and summarize the experimental results, identify key performance indicators, and discuss the latest trends in the field of industrial anomaly detection. Beyond analysis, we contribute actionable insights for selecting optimal models for real-world deployment. Finally, we highlight open challenges and outline future research directions to drive innovation in this evolving field. The detailed resources are available at https://github.com/IHPCRits/IAD-Survey.
期刊介绍:
Artificial Intelligence Review, a fully open access journal, publishes cutting-edge research in artificial intelligence and cognitive science. It features critical evaluations of applications, techniques, and algorithms, providing a platform for both researchers and application developers. The journal includes refereed survey and tutorial articles, along with reviews and commentary on significant developments in the field.