{"title":"Demonstration of a Re-Activatable Scandate Cathode for a High-Current Sheet Beam Electron Gun","authors":"Zhifang Lyu;Shengkun Jiang;Yasong Fan;Dejun Jin;Jibo Dong;Huarong Gong;Yubin Gong;Jiasong Wang;Pan Pan;Jinjun Feng;Zhaoyun Duan","doi":"10.1109/LED.2025.3599234","DOIUrl":null,"url":null,"abstract":"A re-activatable scandate cathode for a high-current sheet beam electron gun was demonstrated in experiment. The re-activatable scandate cathode was impregnated with high purity emission-active materials composed of <inline-formula> <tex-math>$\\beta $ </tex-math></inline-formula>-Ba2ScAlO5 and Ba3Al2O6, which were synthesized employing the polyacrylamide-assisted sol-gel method. The emission-active materials are essential for the scandate cathode to achieve low hygroscopicity and re-activatability. As a result, the re-activatable scandate cathode exhibits a low mass gain of only 0.005% after 1000 hours in air, and delivers an emission current density of 42 A/cm2 at 1140 °C. The high-performance scandate cathode was integrated into a compact sheet beam electron gun, which features a stepped elliptical focus electrode to enable anisotropic electrostatic compression. At a cathode temperature of 1140 °C and a beam voltage of 24.6 kV, the sheet beam electron gun yields a compressed sheet beam with a peak beam current of 189 mA. During three independent air-exposure, evacuation, and re-activation cycles, the beam current varied by no more than 5%. These findings confirm that the re-activatable scandate cathode is suitable for the high-current sheet beam electron gun.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 10","pages":"1869-1872"},"PeriodicalIF":4.5000,"publicationDate":"2025-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11126116/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A re-activatable scandate cathode for a high-current sheet beam electron gun was demonstrated in experiment. The re-activatable scandate cathode was impregnated with high purity emission-active materials composed of $\beta $ -Ba2ScAlO5 and Ba3Al2O6, which were synthesized employing the polyacrylamide-assisted sol-gel method. The emission-active materials are essential for the scandate cathode to achieve low hygroscopicity and re-activatability. As a result, the re-activatable scandate cathode exhibits a low mass gain of only 0.005% after 1000 hours in air, and delivers an emission current density of 42 A/cm2 at 1140 °C. The high-performance scandate cathode was integrated into a compact sheet beam electron gun, which features a stepped elliptical focus electrode to enable anisotropic electrostatic compression. At a cathode temperature of 1140 °C and a beam voltage of 24.6 kV, the sheet beam electron gun yields a compressed sheet beam with a peak beam current of 189 mA. During three independent air-exposure, evacuation, and re-activation cycles, the beam current varied by no more than 5%. These findings confirm that the re-activatable scandate cathode is suitable for the high-current sheet beam electron gun.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.