Multilayer image authentication using deep search convolution for image integrity protection

IF 3.1 3区 物理与天体物理 Q2 Engineering
Optik Pub Date : 2025-09-13 DOI:10.1016/j.ijleo.2025.172534
Ferda Ernawan , Afrig Aminuddin , Agit Amrullah , Dhani Ariatmanto , Achraf Daoui
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引用次数: 0

Abstract

A fragile image watermarking framework can be employed to ascertain any modifications that may have occurred within the image content. This manuscript introduces a deep search convolution for the localization of tampering, utilizing multiple layers of authentication alongside a chaotic map. The proposed approach generates three distinct metrics of scrambled bits through the application of a chaotic map. Each matrix corresponds in size to the cover color image. Subsequently, the watermark data is created using the parity of the seven most significant bits of the image, along with a scrambled bit, and then embedded into the least significant bit of each pixel. The findings illustrate that our scheme is capable of accurately identifying tampered regions in scenarios involving copy-move forgery, removal, additional text, noise, and collage attacks. The proposed scheme attained a remarkable tamper localization accuracy of approximately 0.9995, alongside an average computational time of about 6.5964 s, which is superior to or comparable with existing tamper detection algorithms. Furthermore, the proposed method yielded a PSNR of 51 dB and an SSIM of 0.9992.
基于深度搜索卷积的多层图像认证图像完整性保护
可以使用脆弱的图像水印框架来确定图像内容中可能发生的任何修改。本文介绍了一种用于篡改定位的深度搜索卷积,利用多层认证和混沌映射。该方法通过混沌映射的应用产生三种不同的置乱位度量。每个矩阵的大小对应于封面彩色图像。随后,水印数据使用图像的七个最有效位的奇偶校验,以及一个打乱的位,然后嵌入到每个像素的最低有效位。研究结果表明,我们的方案能够在涉及复制-移动伪造、删除、附加文本、噪声和拼贴攻击的情况下准确识别篡改区域。该方案的篡改定位精度约为0.9995,平均计算时间约为6.5964 s,优于或与现有的篡改检测算法相当。此外,该方法的PSNR为51 dB, SSIM为0.9992。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Optik
Optik 物理-光学
CiteScore
6.90
自引率
12.90%
发文量
1471
审稿时长
46 days
期刊介绍: Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields: Optics: -Optics design, geometrical and beam optics, wave optics- Optical and micro-optical components, diffractive optics, devices and systems- Photoelectric and optoelectronic devices- Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials- Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis- Optical testing and measuring techniques- Optical communication and computing- Physiological optics- As well as other related topics.
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