Evaluation of imaging plate sensitivities to ion beams.

Abstract

Since its sensitivity to ion beams is high, an imaging plate is often utilized for beam measurements. However, as its sensitivities to light- and heavy-ion beams appear different, the sensitivity model of an imaging plate for light-ion beams is not applicable to heavy-ion beams. In addition, the parameters defined in the model for heavy-ion beams must be examined for each ion species. This study focused on a new energy deposition model to estimate the sensitivity to all ion species. We applied this model to previous experimental studies and found that this model, with constant parameter values, can explain the results of most of the earlier studies. The characteristics of the sensitivities to each type of imaging plate and scanner model were also studied. This analysis model might help predict the as yet unexamined sensitivities of imaging plates to ion beams.