{"title":"Exploring the Optimal Solution for Graphene-Based Microstrip Line Attenuators","authors":"Yuhan Li;Cheng Chen;Jingfeng Liu;Jiaxuan Xue;Jixin Wang;Wu Zhao;Zhiyong Zhang;Johan Stiens","doi":"10.1109/TDMR.2025.3578061","DOIUrl":null,"url":null,"abstract":"This study explores optimization strategies for the attenuation performance and modulation depth of Graphene-based Microstrip Line Attenuators (GMSLAs). Existing GMSLAs mainly rely on rectangular attenuation units, such as single-layer graphene sheets and graphene composite sandwich structures, which have limitations in meeting diverse performance requirements. To address this, this study systematically investigates which configuration within the same class of structures yields the most optimal and reliable attenuation performance. Using finite element simulations, this study systematically examines the attenuation performance and modulation characteristics of graphene ring-shaped attenuation units with five distinct geometric configurations (circle, regular triangle, square, regular pentagon, and regular hexagon) in the 40-70 GHz V-band. The results indicate that among individual units, the hexagonal unit exhibits the highest average reflection transmission loss and modulation depth. The triangular unit demonstrates a relatively stable and high average reflection transmission loss as well as the most stable modulation depth, whereas the square unit possesses the most stable average reflection transmission loss. Furthermore, by adjusting the rotation angle of the hexagonal units, significant polarization-dependent attenuation was observed. When combining multiple hexagonal units, their performance exceeded the simple sum of individual unit performances, showing superlinear growth. This study overcomes the limitations of traditional graphene attenuation unit designs by introducing a range of geometric configurations, offering new insights into the development of highly efficient, tunable attenuators with superior performance in high-frequency bands.","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 3","pages":"617-628"},"PeriodicalIF":2.3000,"publicationDate":"2025-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Device and Materials Reliability","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11029032/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This study explores optimization strategies for the attenuation performance and modulation depth of Graphene-based Microstrip Line Attenuators (GMSLAs). Existing GMSLAs mainly rely on rectangular attenuation units, such as single-layer graphene sheets and graphene composite sandwich structures, which have limitations in meeting diverse performance requirements. To address this, this study systematically investigates which configuration within the same class of structures yields the most optimal and reliable attenuation performance. Using finite element simulations, this study systematically examines the attenuation performance and modulation characteristics of graphene ring-shaped attenuation units with five distinct geometric configurations (circle, regular triangle, square, regular pentagon, and regular hexagon) in the 40-70 GHz V-band. The results indicate that among individual units, the hexagonal unit exhibits the highest average reflection transmission loss and modulation depth. The triangular unit demonstrates a relatively stable and high average reflection transmission loss as well as the most stable modulation depth, whereas the square unit possesses the most stable average reflection transmission loss. Furthermore, by adjusting the rotation angle of the hexagonal units, significant polarization-dependent attenuation was observed. When combining multiple hexagonal units, their performance exceeded the simple sum of individual unit performances, showing superlinear growth. This study overcomes the limitations of traditional graphene attenuation unit designs by introducing a range of geometric configurations, offering new insights into the development of highly efficient, tunable attenuators with superior performance in high-frequency bands.
期刊介绍:
The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.