{"title":"DCGAN-Driven Minority Class Augmentation for Lightweight YOLO-Based Photovoltaic Defect Localization Suitable for Edge Deployment","authors":"Nakka Saampotth Maddileti;Rupesh Namburi;Rayappa David Amar Raj;Rama Muni Reddy Yanamala;Archana Pallakonda","doi":"10.1109/TDMR.2025.3592416","DOIUrl":null,"url":null,"abstract":"This study presents YOLOv11n-GhostLite, an innovative lightweight deep learning architecture optimized for real-time localization of photovoltaic (PV) faults in electroluminescence (EL) images, specifically designed for edge deployment. A Deep Convolutional Generative Adversarial Network (DCGAN)-based synthetic augmentation pipeline is presented to address the issues of class imbalance and limited resource availability, generating high-fidelity, class-conditional EL images that include realistic banding artifacts. This method enhances the representation of minority defect categories by more than 150%, elevating the mean Average Precision (mAP@50) by 4% and decreasing false negatives by 5%. The proposed model incorporates GhostConv for efficient early feature extraction, C3k2 residual blocks for deep representation learning, GhostSPPF for multi-scale context aggregation, C2PSA attention for adaptive feature refinement, and an anchor-free detection head, achieving high performance with only 2.34 million parameters and 6.2 GFLOPs. Detailed experiments on two benchmark datasets PVEL-AD and PV Multi-Defect exhibit the model’s efficacy, attaining 97.2% mAP@50 on PVEL-AD, and 96.4% mAP@50 on PV Multi-Defect, outperforming larger models in both accuracy and speed. The model is further deployed on a Google Coral Edge TPU, demonstrating its real-time functionality with minimal power consumption (~2W) and suitable latency for drone-based solar inspections. YOLOv11n-GhostLite’s integration of efficient architecture and data-driven augmentation renders it an effective solution for scalable, real-time photovoltaic fault detection in resource-limited settings.","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 3","pages":"742-751"},"PeriodicalIF":2.3000,"publicationDate":"2025-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Device and Materials Reliability","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11096051/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This study presents YOLOv11n-GhostLite, an innovative lightweight deep learning architecture optimized for real-time localization of photovoltaic (PV) faults in electroluminescence (EL) images, specifically designed for edge deployment. A Deep Convolutional Generative Adversarial Network (DCGAN)-based synthetic augmentation pipeline is presented to address the issues of class imbalance and limited resource availability, generating high-fidelity, class-conditional EL images that include realistic banding artifacts. This method enhances the representation of minority defect categories by more than 150%, elevating the mean Average Precision (mAP@50) by 4% and decreasing false negatives by 5%. The proposed model incorporates GhostConv for efficient early feature extraction, C3k2 residual blocks for deep representation learning, GhostSPPF for multi-scale context aggregation, C2PSA attention for adaptive feature refinement, and an anchor-free detection head, achieving high performance with only 2.34 million parameters and 6.2 GFLOPs. Detailed experiments on two benchmark datasets PVEL-AD and PV Multi-Defect exhibit the model’s efficacy, attaining 97.2% mAP@50 on PVEL-AD, and 96.4% mAP@50 on PV Multi-Defect, outperforming larger models in both accuracy and speed. The model is further deployed on a Google Coral Edge TPU, demonstrating its real-time functionality with minimal power consumption (~2W) and suitable latency for drone-based solar inspections. YOLOv11n-GhostLite’s integration of efficient architecture and data-driven augmentation renders it an effective solution for scalable, real-time photovoltaic fault detection in resource-limited settings.
期刊介绍:
The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.