Study of the Reliability of the Switching-On Process of LV Relays Powered by Distorted AC Supply Source

IF 5.7 2区计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Transactions on Reliability Pub Date : 2025-02-28 DOI:10.1109/TR.2025.3540517

Dariusz Smugala;Pawel Albrechtowicz

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Abstract

The article presents research on the reliability of the switching-on process of electromagnetically actuated alternating current (AC) low voltage relays powered by distorted voltage waveforms. The aim of the research was to assess the influence of the nature and level of supply source distortions on particular switching-on time-related parameters. A measurement stand and software developed for the purposes of the experiments allowed for recognizing the impact of particular factors describing dynamics of the switching-on process. During tests, driving coils of relays were powered through the various AC voltage waveforms characterized by similar total harmonic distortion (THD) values that were applied at different phases of voltage waveform. Performed laboratory measurements showed the various impact of individual parameters (RMS value, shape, harmonic content, THD factor) on the reliability of the switching-on operation, e.g., switching time, contact loss, connection reliability. The carried-out analysis indicated the main factors and their impact level upon the reliability of the switching-on process.

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畸变交流电源供电的低压继电器接通过程可靠性研究

本文研究了由畸变电压波形供电的电磁驱动交流（AC）低压继电器开关过程的可靠性。研究的目的是评估供电源扭曲的性质和程度对特定接通时间相关参数的影响。为实验目的而开发的测量台和软件允许识别描述开关过程动力学的特定因素的影响。在测试过程中，继电器的驱动线圈通过施加在电压波形不同相位的具有相似总谐波失真（THD）值的各种交流电压波形供电。进行的实验室测量显示了各个参数（均方根值、形状、谐波含量、THD因子）对开关操作可靠性的各种影响，例如开关时间、触点损耗、连接可靠性。通过分析，指出了影响接通过程可靠性的主要因素及其影响程度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Reliability 工程技术-工程：电子与电气

CiteScore

12.20

自引率

8.50%

发文量

153

审稿时长

7.5 months

期刊介绍： IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.