FNS-CATF-CAC: An Efficient Crosstalk Avoidance Code to Reduce the Switching Activity in TSV Arrays

IF 5.7 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Chen Wei;Xiaole Cui
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引用次数: 0

Abstract

The through silicon via (TSV) arrays play the role of vertical electrical interconnections in the 3-D stacked integrated circuits. However, the coupling crosstalk between the adjacent TSVs increases the interconnection delay and deteriorates the signal integrity in TSV arrays. The crosstalk avoidance code (CAC) techniques based on the Fibonacci numeral system (FNS) or the improved FNS are capable of mitigating the crosstalk in TSV arrays, but the existing schemes are hindered by the hardware overhead, crosstalk suppression ability and switching activity. This article proposes the FNS-based cyclic adjacent transition free CAC with the ouroboros mapping rule for the rectangular and hexagonal TSV arrays. The proposed scheme can reduce the crosstalk even in the presence of the edge effect. Compared with the previous methods, the proposed scheme consumes significantly small hardware overhead in large-scale arrays. And the proposed method can reduce the switching activity on TSVs, thereby alleviating the power consumption in TSV arrays.
FNS-CATF-CAC:一种有效的串扰避免码,以减少TSV阵列中的切换活动
通过硅孔(TSV)阵列在三维堆叠集成电路中起着垂直电互连的作用。然而,相邻TSV之间的耦合串扰增加了TSV阵列的互连延迟,降低了信号的完整性。基于斐波那契数系统(FNS)或改进FNS的串扰避免码(CAC)技术能够缓解TSV阵列中的串扰,但现有方案受硬件开销、串扰抑制能力和切换活动的限制。针对矩形和六边形TSV阵列,提出了一种基于fns的循环相邻无跃迁CAC算法。该方案可以在存在边缘效应的情况下减小串扰。与以前的方法相比,该方案在大规模阵列中消耗的硬件开销明显小。该方法可以减少TSV上的开关活动,从而降低TSV阵列的功耗。
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来源期刊
IEEE Transactions on Reliability
IEEE Transactions on Reliability 工程技术-工程:电子与电气
CiteScore
12.20
自引率
8.50%
发文量
153
审稿时长
7.5 months
期刊介绍: IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.
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