{"title":"A Unified Optimization Model for Vertical Power High- k Superjunction With NPT and PT Modes","authors":"Haimeng Huang;Chenxing Wang;Zhentao Xiao","doi":"10.1109/LED.2025.3588725","DOIUrl":null,"url":null,"abstract":"This letter introduces a simplified electric field model for high-<inline-formula> <tex-math>$\\boldsymbol {k}$ </tex-math></inline-formula> superjunctions (H<inline-formula> <tex-math>$\\boldsymbol {k}$ </tex-math></inline-formula>SJs) under the punch-through (PT) mode, and its novel modification for the non-punch-through (NPT) mode, which is further extended to incorporate interface charges (<inline-formula> <tex-math>${Q}_{\\text {it}}$ </tex-math></inline-formula>) at the heterointerface. A unified optimization framework for PT and NPT modes is developed and compares width-based and aspect ratio (AR)-based strategies, obtaining the minimum specific ON-resistance (<inline-formula> <tex-math>${R}_{\\text {on,sp}}$ </tex-math></inline-formula>) under the designed breakdown voltage (BV). The analytical results of <inline-formula> <tex-math>${R}_{\\text {on,sp}}$ </tex-math></inline-formula> are in good agreement with MEDICI simulations and a refined <inline-formula> <tex-math>${R}_{\\text {on,sp}} \\propto \\text { BV}^{\\text {1.37}}$ </tex-math></inline-formula> is obtained under given Hk-pillar width (b) and permittivity ratio (<inline-formula> <tex-math>${K}_{\\text {r}}$ </tex-math></inline-formula>). It aslo reveals that H<inline-formula> <tex-math>$\\boldsymbol {k}$ </tex-math></inline-formula>SJs with the same product of b and <inline-formula> <tex-math>${K}_{\\text {r}}$ </tex-math></inline-formula> exhibit identical<sc>on</small>-resistance. Furthermore, a theoretical limit of <inline-formula> <tex-math>${R}_{\\text {on,sp}} \\propto \\text { BV}^{\\text {1.06}}$ </tex-math></inline-formula> and an estimated saturation threshold for dielectric benefits are identified to reduce the need for high-<inline-formula> <tex-math>$\\boldsymbol {k}$ </tex-math></inline-formula> materials. This work establishes a compact and generalizable framework for modeling and optimizing HkSJs, supported by simulation benchmarks and offering practical guidance for device design.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 9","pages":"1585-1588"},"PeriodicalIF":4.5000,"publicationDate":"2025-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11079658/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This letter introduces a simplified electric field model for high-$\boldsymbol {k}$ superjunctions (H$\boldsymbol {k}$ SJs) under the punch-through (PT) mode, and its novel modification for the non-punch-through (NPT) mode, which is further extended to incorporate interface charges (${Q}_{\text {it}}$ ) at the heterointerface. A unified optimization framework for PT and NPT modes is developed and compares width-based and aspect ratio (AR)-based strategies, obtaining the minimum specific ON-resistance (${R}_{\text {on,sp}}$ ) under the designed breakdown voltage (BV). The analytical results of ${R}_{\text {on,sp}}$ are in good agreement with MEDICI simulations and a refined ${R}_{\text {on,sp}} \propto \text { BV}^{\text {1.37}}$ is obtained under given Hk-pillar width (b) and permittivity ratio (${K}_{\text {r}}$ ). It aslo reveals that H$\boldsymbol {k}$ SJs with the same product of b and ${K}_{\text {r}}$ exhibit identicalon-resistance. Furthermore, a theoretical limit of ${R}_{\text {on,sp}} \propto \text { BV}^{\text {1.06}}$ and an estimated saturation threshold for dielectric benefits are identified to reduce the need for high-$\boldsymbol {k}$ materials. This work establishes a compact and generalizable framework for modeling and optimizing HkSJs, supported by simulation benchmarks and offering practical guidance for device design.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.