{"title":"β-Ga₂O₃ Schottky Barrier Diodes Utilizing Ammonia Plasma Surface Treatment Yield Enhanced Characteristics","authors":"Haodong Hu;Xiaole Jia;Yibo Wang;Shuqi Huang;Bochang Li;Cizhe Fang;Haiwen Xu;Xiaoxi Li;Zhengdong Luo;Yan Liu;Yue Hao;Genquan Han","doi":"10.1109/LED.2025.3587728","DOIUrl":null,"url":null,"abstract":"In this work, we demonstrate high-performance vertical <inline-formula> <tex-math>$\\beta $ </tex-math></inline-formula>-Ga2O3 Schottky barrier diodes (SBDs) using ammonia plasma surface treatment (APT) and self-aligned mesa termination (MT). The APT reduces the interface trap density to <inline-formula> <tex-math>$3.6\\times 10^{{11}}$ </tex-math></inline-formula> cm<inline-formula> <tex-math>${}^{-{2}}$ </tex-math></inline-formula> eV<inline-formula> <tex-math>${}^{-{1}}$ </tex-math></inline-formula>, while the MT suppresses the peak electric field at the anode edge. This combination results in a breakdown voltage of 2034 V with a specific on-resistance of 3.31 m<inline-formula> <tex-math>$\\Omega \\cdot $ </tex-math></inline-formula> cm2, achieving a high power figure of merit of 1.25 GW/cm2. The reduction of Ga-suboxide and adsorbed oxygen improves the interface quality of Ni/<inline-formula> <tex-math>$\\beta $ </tex-math></inline-formula>-Ga2O3 SBDs by APT, leading to excellent forward characteristics with an ideality factor reaching 1.012. This work highlights the potential of combining APT and MT to enhance <inline-formula> <tex-math>$\\beta $ </tex-math></inline-formula>-Ga2O3 SBDs for power applications.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 9","pages":"1485-1488"},"PeriodicalIF":4.5000,"publicationDate":"2025-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11077367/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, we demonstrate high-performance vertical $\beta $ -Ga2O3 Schottky barrier diodes (SBDs) using ammonia plasma surface treatment (APT) and self-aligned mesa termination (MT). The APT reduces the interface trap density to $3.6\times 10^{{11}}$ cm${}^{-{2}}$ eV${}^{-{1}}$ , while the MT suppresses the peak electric field at the anode edge. This combination results in a breakdown voltage of 2034 V with a specific on-resistance of 3.31 m$\Omega \cdot $ cm2, achieving a high power figure of merit of 1.25 GW/cm2. The reduction of Ga-suboxide and adsorbed oxygen improves the interface quality of Ni/$\beta $ -Ga2O3 SBDs by APT, leading to excellent forward characteristics with an ideality factor reaching 1.012. This work highlights the potential of combining APT and MT to enhance $\beta $ -Ga2O3 SBDs for power applications.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.