Low-Power and High-Speed Ag2S-Based Threshold Switching Device Enabled by Local Phase Transition-Assisted Filamentary Switching

IF 3.2 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Seongjae Heo;Sunhyeong Lee;Hyunsang Hwang
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Abstract

As the demand for low-power electronic devices in the Internet of Things (IoT) and embedded systems continues to grow, there is an increasing need for new devices that can operate at low voltages with minimal leakage current while maintaining fast switching speeds. To address this challenge, we developed a two-terminal threshold switching (TS) device based on Ag2S, demonstrating both low leakage current and fast switching speed at low voltages. The Ag2S-based TS devices were integrated in series with MOSFETs to form a 1T-1S array, designed for steep-slope FET applications. The Ag2S-based TS device exhibited a low leakage current of 2 pA, and when integrated with the MOSFET, the combined FET demonstrated a subthreshold swing (SS) of 3 mV/dec. Remarkably, the device exhibited a fast switching speed of 1 ns at 2.0 V. In addition, as the Ag2S composition approached stoichiometry, both leakage current and threshold voltage decreased, alleviating the voltage–time dilemma typically encountered in filamentary switching devices. These enhanced properties are attributed to the local phase transition of Ag2S and superionic conductivity of $\beta $ -Ag2S, which facilitate rapid ion transport and filament formation under an electric field. Furthermore, at a compliance current of $30~\mu $ A, the device demonstrated a turn-off speed of tens of nanoseconds. By increasing the compliance current to several hundred microamperes, the device also exhibited a short-term retention of several minutes, showing potential for application in next-generation DRAM-like volatile memory.
基于局域相变辅助细丝开关的低功耗高速ag2s阈值开关器件
随着物联网(IoT)和嵌入式系统中对低功耗电子设备的需求不断增长,对能够在低电压下以最小泄漏电流工作同时保持快速开关速度的新设备的需求越来越大。为了解决这一挑战,我们开发了一种基于Ag2S的双端阈值开关(TS)器件,该器件在低电压下具有低泄漏电流和快速开关速度。基于ag2的TS器件与mosfet串联集成,形成1T-1S阵列,专为陡坡FET应用而设计。基于ag2的TS器件具有2 pA的低漏电流,当与MOSFET集成时,该组合FET的亚阈值摆幅(SS)为3 mV/dec。值得注意的是,该器件在2.0 V下表现出1 ns的快速开关速度。此外,当Ag2S成分接近化学计量时,漏电流和阈值电压都降低了,从而缓解了线状开关器件中通常遇到的电压-时间困境。这些增强的性能归因于Ag2S的局部相变和$\beta $ -Ag2S的超离子导电性,它们促进了离子在电场下的快速传输和细丝的形成。此外,在$30~\mu $ a的顺应电流下,该器件的关断速度为数十纳秒。通过将顺应电流增加到几百微安,该器件还表现出了几分钟的短期保留,显示出在下一代类似dram的易失性存储器中的应用潜力。
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来源期刊
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices 工程技术-工程:电子与电气
CiteScore
5.80
自引率
16.10%
发文量
937
审稿时长
3.8 months
期刊介绍: IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
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