Yonggui Zhai;Rui Wang;Hongguang Wang;Meng Cao;Shu Lin;Na Zhang;Yun Li;Wanzhao Cui;Yongdong Li
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引用次数: 0
Abstract
This study proposes a method for suppressing the multipactor effect in high-power microwave devices for spacecraft applications by integrating dielectric materials. Electromagnetic fields are numerically analyzed using the CST Microwave Studio, while multipactor thresholds are accurately predicted via an in-house developed 3-D particle-in-cell (PIC) simulation code. A systematic investigation is conducted to examine how the geometric parameters and material properties of dielectric influence multipactor. Simulation results show that when the dielectric width matches that of a parallel-plate or rectangular waveguide, increasing both the thickness and relative permittivity enhances the amplitude of the radio frequency (RF) electric field, accompanied by a decrease in the multipactor threshold. Conversely, when the dielectric width is smaller than the waveguide, the RF electric field amplitude decreases, leading to an increase in the multipactor threshold. Notably, partially filled dielectric can reduce the RF electric field amplitude by up to 90%, and improve the threshold by as much as 40 times compared to unfilled dielectric. These findings provide critical design insights for high-power microwave components in space applications.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.