{"title":"Back-Illuminated AlGaN-Based Solar-Blind Ultraviolet Photodetectors With High-Temperature Photoresponse Stability","authors":"Zixi Lv;Wenkuo Zhang;Jiagui Li;Wei Zeng;Benli Yu;Feng Xie","doi":"10.1109/TED.2025.3592914","DOIUrl":null,"url":null,"abstract":"A high thermal stability AlGaN-based back-illuminated solar-blind ultraviolet (SBUV) p-i-n photodetectors (PDs) are fabricated on double-sided, polished sapphire substrates. The PD exhibits low dark current of less than 18 pA under –5 V bias at room temperature (RT), which corresponds to a dark current density of <inline-formula> <tex-math>$\\lt 1.8\\times 10^{-{9}}$ </tex-math></inline-formula> A/cm2. Even at a high temperature of <inline-formula> <tex-math>$150~^{\\circ }$ </tex-math></inline-formula>C, the dark current of the PD is still below 50 pA. The PD also shows a high solar-blind/UV rejection ratio up to four orders of magnitude in the temperature range of RT to <inline-formula> <tex-math>$150~^{\\circ }$ </tex-math></inline-formula>C. As the temperature continuously rises from RT to <inline-formula> <tex-math>$150~^{\\circ }$ </tex-math></inline-formula>C, the photocurrent of the PD only increases by less than 8%, which corresponds to an extremely small temperature coefficient (TC) of <0.06%/°C. The ultralow TC achieved is believed to be related to the high polarization electric field at the composition-graded heterojunction interface.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"72 9","pages":"5247-5250"},"PeriodicalIF":3.2000,"publicationDate":"2025-07-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11105471/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A high thermal stability AlGaN-based back-illuminated solar-blind ultraviolet (SBUV) p-i-n photodetectors (PDs) are fabricated on double-sided, polished sapphire substrates. The PD exhibits low dark current of less than 18 pA under –5 V bias at room temperature (RT), which corresponds to a dark current density of $\lt 1.8\times 10^{-{9}}$ A/cm2. Even at a high temperature of $150~^{\circ }$ C, the dark current of the PD is still below 50 pA. The PD also shows a high solar-blind/UV rejection ratio up to four orders of magnitude in the temperature range of RT to $150~^{\circ }$ C. As the temperature continuously rises from RT to $150~^{\circ }$ C, the photocurrent of the PD only increases by less than 8%, which corresponds to an extremely small temperature coefficient (TC) of <0.06%/°C. The ultralow TC achieved is believed to be related to the high polarization electric field at the composition-graded heterojunction interface.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.