Ying-Qi Liu;Bo-Wei Huang;Chun-Yi Cheng;Wei-Jen Chen;Min-Kuan Lin;Yi Huang;Ding-Wei Lin;C. W. Liu
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引用次数: 0
Abstract
A novel device integration scheme for dual-work-function-metal split-gate complementary FETs (CFETs) is demonstrated. Multiple p/n junctions are used to electrically isolate the vertically stacked transistors. The effective work function (EWF) of WNxCy is modulated by the N2/H2 flow ratio during the plasma-enhanced atomic layer deposition (PEALD) process. A ~10-nm-thick WNxCy layer enables ${V}_{\text {TP}}$ (threshold voltage of pFETs) tunability up to 500 mV, while TiN is used as work function metal (WFM) for nFETs. The dual-WFM split-gate architecture achieves well-balanced threshold voltages, with a $\vert {V}_{\text {TP}}\vert $ /$\vert {V}_{\text {TN}}\vert $ ratio of 0.93. Furthermore, the CFET inverter with dual WFMs and split gate reaches a record-high voltage gain of 61 V/V among reported monolithic nanosheet CFETs.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.