{"title":"Effect of the Organic Buffer Layer on Charge Injection and Transport Characteristics in Organic Transistors With Different Channel Lengths","authors":"Walid Boukhili;Swelm Wageh;Quanhua Chen;Fathi Jomni;Xiang Wan;Zhihao Yu;Chee Leong Tan;Huabin Sun;Yong Xu;Dongyoon Khim","doi":"10.1109/TED.2025.3586223","DOIUrl":null,"url":null,"abstract":"Extensive research on channel downscaling has led to notable advancements in semiconductor technology. Studying the size reduction of organic transistors remains an important task that necessitates a comprehensive understanding, especially for the short-channel effect. In this work, we investigated the impacts of the insertion of the organic buffer layer and channel length scaling on contact resistance, charge transport, and, consequently, the device performance. Incorporation of an organic buffer layer between the source/drain (S/D) electrodes and the organic semiconductor (OSC) leads to a substantially decreased contact resistance, closely correlated with improved drain-induced barrier lowering (DIBL) and interface trap density. This behavior is especially noticeable in devices with shorter channel lengths, where the contacts play a critical role in the whole charge transport. Our results provide insights into the development of upcoming electronic components, specifically in the field of organic field-effect transistor (OFET) device physics, with short channel lengths.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"72 9","pages":"5123-5129"},"PeriodicalIF":3.2000,"publicationDate":"2025-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11082523/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Extensive research on channel downscaling has led to notable advancements in semiconductor technology. Studying the size reduction of organic transistors remains an important task that necessitates a comprehensive understanding, especially for the short-channel effect. In this work, we investigated the impacts of the insertion of the organic buffer layer and channel length scaling on contact resistance, charge transport, and, consequently, the device performance. Incorporation of an organic buffer layer between the source/drain (S/D) electrodes and the organic semiconductor (OSC) leads to a substantially decreased contact resistance, closely correlated with improved drain-induced barrier lowering (DIBL) and interface trap density. This behavior is especially noticeable in devices with shorter channel lengths, where the contacts play a critical role in the whole charge transport. Our results provide insights into the development of upcoming electronic components, specifically in the field of organic field-effect transistor (OFET) device physics, with short channel lengths.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.