{"title":"Tetragonal gallium phosphide monolayer: A promising anode material for sodium-ion batteries","authors":"Nguyen Xuan Sang , Ismail Shahid , K.D. Pham","doi":"10.1016/j.mssp.2025.109968","DOIUrl":null,"url":null,"abstract":"<div><div>In this study, we systematically investigate the crystal structure, electronic properties, and mechanical behavior of the tetragonal GaP monolayer. Furthermore, we examine the adsorption characteristics of Na atoms on the GaP monolayer and evaluate its practical viability as an anode material for sodium-ion batteries. Our findings reveal that the tetragonal GaP monolayer exhibits metallic characteristics and possesses remarkable mechanical flexibility. Notably, it demonstrates anisotropic mechanical responses and a low Na-ion diffusion energy barrier of 0.23 eV. Additionally, the GaP monolayer shows a high theoretical storage capacity of 798.46 mAh/g along with a moderate working voltage, making it a promising candidate for Na-ion battery applications.</div></div>","PeriodicalId":18240,"journal":{"name":"Materials Science in Semiconductor Processing","volume":"200 ","pages":"Article 109968"},"PeriodicalIF":4.6000,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science in Semiconductor Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S136980012500705X","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this study, we systematically investigate the crystal structure, electronic properties, and mechanical behavior of the tetragonal GaP monolayer. Furthermore, we examine the adsorption characteristics of Na atoms on the GaP monolayer and evaluate its practical viability as an anode material for sodium-ion batteries. Our findings reveal that the tetragonal GaP monolayer exhibits metallic characteristics and possesses remarkable mechanical flexibility. Notably, it demonstrates anisotropic mechanical responses and a low Na-ion diffusion energy barrier of 0.23 eV. Additionally, the GaP monolayer shows a high theoretical storage capacity of 798.46 mAh/g along with a moderate working voltage, making it a promising candidate for Na-ion battery applications.
期刊介绍:
Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.
Each issue will aim to provide a snapshot of current insights, new achievements, breakthroughs and future trends in such diverse fields as microelectronics, energy conversion and storage, communications, biotechnology, (photo)catalysis, nano- and thin-film technology, hybrid and composite materials, chemical processing, vapor-phase deposition, device fabrication, and modelling, which are the backbone of advanced semiconductor processing and applications.
Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.