Co-sputtered thin films of silver-ion-conductive GeS2-Sb2S3-AgI solid electrolytes

IF 2 4区 材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS
Bo Fan , Yitao Yang , Jiong Ding , Chengwei Gao , Changgui Lin , Bai Xue
{"title":"Co-sputtered thin films of silver-ion-conductive GeS2-Sb2S3-AgI solid electrolytes","authors":"Bo Fan ,&nbsp;Yitao Yang ,&nbsp;Jiong Ding ,&nbsp;Chengwei Gao ,&nbsp;Changgui Lin ,&nbsp;Bai Xue","doi":"10.1016/j.tsf.2025.140769","DOIUrl":null,"url":null,"abstract":"<div><div>Fast silver-ion-conducting chalcogenide glassy electrolyte thin films demonstrate remarkable application potential in miniaturized solid-state energy storage devices. However, the application of Ag-based film cell is retarded by the lack of large-scale film fabrication method. Thus, this study employs magnetron co-sputtering, a technique amenable to large-scale production, to fabricate GeS₂-Sb₂S₃-AgI glassy electrolyte films, with AgI incorporation fraction modulated by sputtering power to tailor the microstructure and ion transport characteristics. Systematic characterization reveals that AgI incorporation promotes the formation of SbSI/SbI₃-like structures within the amorphous matrix, thereby triggering the reconstruction of the chalcogenide network. Adjusting the sputtering power of AgI to 8 W, the thin films exhibit a dense amorphous state and achieve an optimal room-temperature conductivity of 5.32 × 10⁻⁴ S cm⁻¹. Further increase in sputtering power triggers columnar film growth, disrupting the structural continuity and causing a two-order conductivity drop. Silver nanoparticles have been electroplated onto the electrolyte films by a scanning probe electrochemical deposition experiment, confirming the lateral migration capability of Ag⁺ ions within the films. This work could provide vital understanding of fabrication of glassy electrolyte films.</div></div>","PeriodicalId":23182,"journal":{"name":"Thin Solid Films","volume":"826 ","pages":"Article 140769"},"PeriodicalIF":2.0000,"publicationDate":"2025-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thin Solid Films","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0040609025001683","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, COATINGS & FILMS","Score":null,"Total":0}
引用次数: 0

Abstract

Fast silver-ion-conducting chalcogenide glassy electrolyte thin films demonstrate remarkable application potential in miniaturized solid-state energy storage devices. However, the application of Ag-based film cell is retarded by the lack of large-scale film fabrication method. Thus, this study employs magnetron co-sputtering, a technique amenable to large-scale production, to fabricate GeS₂-Sb₂S₃-AgI glassy electrolyte films, with AgI incorporation fraction modulated by sputtering power to tailor the microstructure and ion transport characteristics. Systematic characterization reveals that AgI incorporation promotes the formation of SbSI/SbI₃-like structures within the amorphous matrix, thereby triggering the reconstruction of the chalcogenide network. Adjusting the sputtering power of AgI to 8 W, the thin films exhibit a dense amorphous state and achieve an optimal room-temperature conductivity of 5.32 × 10⁻⁴ S cm⁻¹. Further increase in sputtering power triggers columnar film growth, disrupting the structural continuity and causing a two-order conductivity drop. Silver nanoparticles have been electroplated onto the electrolyte films by a scanning probe electrochemical deposition experiment, confirming the lateral migration capability of Ag⁺ ions within the films. This work could provide vital understanding of fabrication of glassy electrolyte films.
银离子导电GeS2-Sb2S3-AgI固体电解质共溅射薄膜
快速银离子导电硫系玻璃电解质薄膜在小型化固态储能器件中具有显著的应用潜力。然而,由于缺乏大规模的薄膜制造方法,银基薄膜电池的应用受到了阻碍。因此,本研究采用一种适合大规模生产的磁控共溅射技术,制备了GeS₂-Sb₂S₃-AgI玻璃电解质薄膜,并通过溅射功率调节AgI的掺入率,以适应其微观结构和离子输运特性。系统表征表明,AgI的掺入促进了非晶基质中SbSI/SbI₃类结构的形成,从而引发硫族化物网络的重建。将AgI的溅射功率调整到8 W,薄膜呈现出致密的无定形状态,并达到5.32 × 10⁻⁴S cm⁻¹的最佳室温电导率。进一步增加溅射功率会触发柱状膜的生长,破坏结构的连续性,导致电导率下降两级。通过扫描探针电化学沉积实验将银纳米粒子电镀到电解质膜上,证实了银⁺在膜内的横向迁移能力。这项工作可以为玻璃电解质薄膜的制备提供重要的理解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Thin Solid Films
Thin Solid Films 工程技术-材料科学:膜
CiteScore
4.00
自引率
4.80%
发文量
381
审稿时长
7.5 months
期刊介绍: Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.
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