{"title":"Orbital validation for tin whisker suppression by conformal coating","authors":"Shinichiro Ichimaru , Tsuyoshi Nakagawa , Norio Nemoto , Katsuaki Suganuma , Hiroaki Tatsumi , Hiroshi Nishikawa","doi":"10.1016/j.microrel.2025.115888","DOIUrl":null,"url":null,"abstract":"<div><div>To investigate the use of lead-free tin-based parts for satellites, the effectiveness of using a conformal coating for suppressing the growth of tin whiskers in Earth orbit was validated. An exposed handrail attachment mechanism on Kibo, the outboard platform of the International Space Station, was used in the experiments in the study. Experimental samples were exposed in orbit for up to four years, and the ability of parylene and polyurethane coatings to suppress whisker growth was investigated. Numerous thin, long, and straight whiskers grew in orbit on the uncoated samples, but the whiskers did not penetrate the parylene- and polyurethane-coated samples. In addition, no whiskers were generated from tin plating under these coatings. Parylene exhibited hardness, which completely suppressed the growth of whiskers and nodules. Polyurethane, being a softer material, showed some nodules under the coating, but no whiskers were observed. Furthermore, there was no difference between the whisker suppression effect in the orbital and ground test samples for both coatings. There was also no significant degradation in the hardness or Young's modulus of the coatings. These results demonstrate that lead-free parts coated with parylene or polyurethane can be used in satellites operating in this orbit for four years. To our knowledge, this is the first study to report and clarify the effects of a conformal coating on whisker suppression in Earth orbit.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"174 ","pages":"Article 115888"},"PeriodicalIF":1.9000,"publicationDate":"2025-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425003014","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
To investigate the use of lead-free tin-based parts for satellites, the effectiveness of using a conformal coating for suppressing the growth of tin whiskers in Earth orbit was validated. An exposed handrail attachment mechanism on Kibo, the outboard platform of the International Space Station, was used in the experiments in the study. Experimental samples were exposed in orbit for up to four years, and the ability of parylene and polyurethane coatings to suppress whisker growth was investigated. Numerous thin, long, and straight whiskers grew in orbit on the uncoated samples, but the whiskers did not penetrate the parylene- and polyurethane-coated samples. In addition, no whiskers were generated from tin plating under these coatings. Parylene exhibited hardness, which completely suppressed the growth of whiskers and nodules. Polyurethane, being a softer material, showed some nodules under the coating, but no whiskers were observed. Furthermore, there was no difference between the whisker suppression effect in the orbital and ground test samples for both coatings. There was also no significant degradation in the hardness or Young's modulus of the coatings. These results demonstrate that lead-free parts coated with parylene or polyurethane can be used in satellites operating in this orbit for four years. To our knowledge, this is the first study to report and clarify the effects of a conformal coating on whisker suppression in Earth orbit.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.