Enhanced Vertical Sidewall Quality for Functional AlN Films in 3D Piezo MEMS Applications

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Arsam Ali, Glenn Ross, Mervi Paulasto-Kröckel
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Abstract

Integrating piezoelectric materials onto the vertical surfaces of microelectromechanical systems (MEMS) microstructures enables three-dimensional piezoelectric (3D piezoMEMS) devices, providing multi-axis sensing and actuation capabilities with a reduced device footprint. Metal–organic chemical vapor deposition (MOCVD) is the preferred method for depositing highly crystalline, c-axis oriented aluminium nitride (AlN). However, achieving optimal film quality requires vertical surfaces with minimal roughness and uniformity. Traditional etching techniques, such as wet and plasma etching, often result in rough and irregular surfaces, which challenge the crystal quality of the deposited AlN. In this study, cryogenic deep reactive ion etching (cryo-DRIE) is used to fabricate vertical sidewalls with a root mean square roughness of 26 nm and waviness of 131 nm, followed by hydrogen annealing to further enhance surface quality. Hydrogen annealing reduces the roughness to 7 nm, but the waviness varies depending on the pre-annealing surface conditions. When AlN is deposited on these treated surfaces using MOCVD, the films exhibit high crystal quality comparable to those grown on wet-etched surfaces with extremely low roughness. A slight misalignment of the AlN c-axis orientation with the Si (111) plane is observed, with localized surface irregularities impacting grain alignment in specific areas.

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三维压电MEMS应用中功能性AlN薄膜垂直侧壁质量的提高
将压电材料集成到微机电系统(MEMS)微结构的垂直表面上,可以实现三维压电(3D piezoMEMS)器件,提供多轴传感和驱动能力,同时减少了器件占地面积。金属有机化学气相沉积(MOCVD)是沉积高结晶、c轴取向氮化铝(AlN)的首选方法。然而,达到最佳的薄膜质量需要具有最小粗糙度和均匀性的垂直表面。传统的蚀刻技术,如湿法和等离子体蚀刻,通常会导致粗糙和不规则的表面,这对沉积AlN的晶体质量提出了挑战。在这项研究中,我们使用低温深度反应离子蚀刻(cryo‐drive)来制造垂直侧壁,其均方根粗糙度为26 nm,波幅为131 nm,然后进行氢退火以进一步提高表面质量。氢退火将粗糙度降低到7 nm,但波浪形取决于退火前的表面条件。当使用MOCVD将AlN沉积在这些处理过的表面上时,薄膜表现出高的晶体质量,与那些生长在具有极低粗糙度的湿蚀刻表面上的薄膜相当。观察到AlN c轴取向与Si(111)平面的轻微错位,局部表面的不规则性影响了特定区域的晶粒取向。
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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
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