Young-Eun Choi;Woo-Seok Kim;Myoung Kim;Junyoung Park;Min Woo Ryu;Kyung Rok Kim
{"title":"Ternary CMOS Compact Model for Low Power On-Chip Memory Applications","authors":"Young-Eun Choi;Woo-Seok Kim;Myoung Kim;Junyoung Park;Min Woo Ryu;Kyung Rok Kim","doi":"10.1109/JEDS.2025.3588398","DOIUrl":null,"url":null,"abstract":"In this work, we present a tunneling based ternary CMOS (T-CMOS) compact model for low power ternary-SRAM (T-SRAM) design using CMOS technology. By designing compact model parameters of band-to-band tunneling current <inline-formula> <tex-math>$(I_{\\mathrm { BTBT}})$ </tex-math></inline-formula> according to effective doping concentration of T-CMOS, more accurate current model has been obtained in comparison with the conventional <inline-formula> <tex-math>$I_{\\mathrm { BTBT}}$ </tex-math></inline-formula> models. In addition, parasitic capacitance models are obtained for transient operation. Comparing model and experimental data, it enables the prediction of T-CMOS performance under various <inline-formula> <tex-math>$V_{\\mathrm { DD}}$ </tex-math></inline-formula> conditions. The model is validated to be more suitable for T-CMOS with low power on-chip memory applications.","PeriodicalId":13210,"journal":{"name":"IEEE Journal of the Electron Devices Society","volume":"13 ","pages":"599-606"},"PeriodicalIF":2.4000,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11079606","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of the Electron Devices Society","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11079606/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, we present a tunneling based ternary CMOS (T-CMOS) compact model for low power ternary-SRAM (T-SRAM) design using CMOS technology. By designing compact model parameters of band-to-band tunneling current $(I_{\mathrm { BTBT}})$ according to effective doping concentration of T-CMOS, more accurate current model has been obtained in comparison with the conventional $I_{\mathrm { BTBT}}$ models. In addition, parasitic capacitance models are obtained for transient operation. Comparing model and experimental data, it enables the prediction of T-CMOS performance under various $V_{\mathrm { DD}}$ conditions. The model is validated to be more suitable for T-CMOS with low power on-chip memory applications.
期刊介绍:
The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC''s, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original.