{"title":"TestLoter: A logic-driven framework for automated unit test generation and error repair using large language models","authors":"Ruofan Yang, Xianghua Xu, Ran Wang","doi":"10.1016/j.cola.2025.101348","DOIUrl":null,"url":null,"abstract":"<div><div>Automated unit test generation is a critical technique for improving software quality and development efficiency. However, traditional methods often produce test cases with poor business consistency, while large language model based approaches face two major challenges: a high error rate in generated tests and insufficient code coverage. To address these issues, this paper proposes TestLoter, a logic-driven test generation framework. The core contributions of TestLoter are twofold. First, by integrating the structured analysis capabilities of white-box testing with the functional validation characteristics of black-box testing, we design a logic-driven test generation chain-of-thought that enables deep semantic analysis of code. Second, we establish a hierarchical repair mechanism to systematically correct errors in generated test cases, significantly enhancing the correctness of the test code. Experimental results on nine open-source projects covering various domains, such as data processing and utility libraries, demonstrate that TestLoter achieves 83.6% line coverage and 78% branch coverage. Our approach outperforms both LLM-based methods and traditional search-based software testing techniques in terms of coverage, while also reducing the number of errors in the generated unit test code.</div></div>","PeriodicalId":48552,"journal":{"name":"Journal of Computer Languages","volume":"84 ","pages":"Article 101348"},"PeriodicalIF":1.8000,"publicationDate":"2025-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Computer Languages","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2590118425000346","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, SOFTWARE ENGINEERING","Score":null,"Total":0}
引用次数: 0
Abstract
Automated unit test generation is a critical technique for improving software quality and development efficiency. However, traditional methods often produce test cases with poor business consistency, while large language model based approaches face two major challenges: a high error rate in generated tests and insufficient code coverage. To address these issues, this paper proposes TestLoter, a logic-driven test generation framework. The core contributions of TestLoter are twofold. First, by integrating the structured analysis capabilities of white-box testing with the functional validation characteristics of black-box testing, we design a logic-driven test generation chain-of-thought that enables deep semantic analysis of code. Second, we establish a hierarchical repair mechanism to systematically correct errors in generated test cases, significantly enhancing the correctness of the test code. Experimental results on nine open-source projects covering various domains, such as data processing and utility libraries, demonstrate that TestLoter achieves 83.6% line coverage and 78% branch coverage. Our approach outperforms both LLM-based methods and traditional search-based software testing techniques in terms of coverage, while also reducing the number of errors in the generated unit test code.