Condition monitoring of a DC-link capacitor in an inverter with a front-end diode rectifier under imbalanced three-phase supply voltage

IF 1.6 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Reliability Pub Date : 2025-07-28 DOI:10.1016/j.microrel.2025.115873

Takuma Yamasoto , Kazunori Hasegawa

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Abstract

DC-link capacitors in inverters have a shorter lifetime than the other devices, and thus degrade reliability of the inverters. The inverters are usually fed by three-phase supply voltages; however, the three-phase voltages are frequently imbalanced due to the connection of single-phase power sources and loads, such as renewable energy, which places additional stress on the DC-link capacitors. This paper proposes a condition monitoring method of a DC-link capacitor without an additional current sensor in an inverter system under the imbalanced three-phase supply voltage. This inverter system employs a front-end six-pulse diode rectifier with a DC reactor. The method is based on an analysis of the rectifier output ripple voltage including the uncharacteristic harmonics that result from imbalanced supply voltage, which is valid in a practical imbalance ratio around 5%. Experimental results obtained from a 200-V 1.5-kW laboratory system confirmed that both the capacitance and ESR were monitored even though the supply voltage was imbalanced.

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三相电源电压不平衡情况下前置二极管整流器逆变器直流电容状态监测

逆变器中的直流电容寿命比其他器件短，从而降低了逆变器的可靠性。逆变器通常由三相电源电压供电；然而，由于单相电源和负载（如可再生能源）的连接，三相电压经常不平衡，这给直流链路电容器带来了额外的压力。本文提出了一种在三相电源电压不平衡情况下，不加电流传感器的直流电容状态监测方法。该逆变系统采用前端六脉冲二极管整流器和直流电抗器。该方法基于对整流器输出纹波电压的分析，包括电源电压不平衡引起的非特征谐波，该方法在实际不平衡率约为5%时有效。在一个200v 1.5 kw的实验系统中得到的实验结果证实，即使电源电压不平衡，电容和ESR也能被监测到。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microelectronics Reliability 工程技术-工程：电子与电气

CiteScore

3.30

自引率

12.50%

发文量

342

审稿时长

68 days

期刊介绍： Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.